Local work function measurements on various inorganic materials using Kelvin probe force spectroscopy

Solid State Phenomena

Volumn 124-126, Issue PART 1, 2007, Pages 607-610

  Kim, Chanhyung ^a   Bae, Changdeuck ^a   Ryu, Kyunghee ^a   Lee, Bongki ^b   Shin, Hyunjung ^a  

^a Kookmin University   (South Korea)

^b The University of Texas at Dallas   (United States)

Author keywords

Contact potential difference; Kelvin probe force microscopy; Local work function

Indexed keywords

GRAPHITE; INDIUM COMPOUNDS; METALLIC FILMS; SEMICONDUCTOR MATERIALS; WORK FUNCTION;

CONTACT POTENTIAL DIFFERENCE; HIGHLY ORIENTED PYROLYTIC GRAPHITE (HOPG); KELVIN PROBE FORCE MICROSCOPY; LOCAL WORK FUNCTION;

INORGANIC COMPOUNDS;

EID: 38549170157     PISSN: 10120394     EISSN: None     Source Type: Book Series    
DOI: 10.4028/3-908451-31-0.607     Document Type: Conference Paper

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