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Volumn 50, Issue 6, 2007, Pages 2257-2265
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Identifying apple surface defects using principal components analysis and artificial neural networks
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Author keywords
Apple; Defects detection; Image processing; Neural networks; Sorting
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Indexed keywords
APPLE SURFACE DEFECTS;
DEFECTS DETECTION;
PREPROCESSING IMAGES;
WIENER FILTERS;
IMAGE PROCESSING;
NEAR INFRARED SPECTROSCOPY;
NEURAL NETWORKS;
PIXELS;
PRINCIPAL COMPONENT ANALYSIS;
SURFACE DEFECTS;
ARTIFICIAL NEURAL NETWORK;
DETECTION METHOD;
FRUIT;
IMAGING METHOD;
NEAR INFRARED;
PERFORMANCE ASSESSMENT;
PIXEL;
PRINCIPAL COMPONENT ANALYSIS;
MALUS X DOMESTICA;
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EID: 38549147537
PISSN: 21510032
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (20)
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References (7)
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