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Journal of Analytical Atomic Spectrometry

Volumn 23, Issue 2, 2008, Pages 193-204

Use of vertically resolved plasma emission as an indicator for flagging matrix effects and system drift in inductively coupled plasma-atomic emission spectrometry

(2) Chan, George C Y a Hieftje, Gary M a

a INDIANA UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC EMISSION SPECTROSCOPY; MEASUREMENT THEORY; SPECTRUM ANALYSIS;

FLAGGING MATRIX EFFECTS; SPECTRAL INTERFERENCE; SYSTEM DRIFT; VERTICALLY RESOLVED PLASMA EMISSION;

INDUCTIVELY COUPLED PLASMA;

EID: 38549125942 PISSN: 02679477 EISSN: 13645544 Source Type: Journal
DOI: 10.1039/b706838g Document Type: Article

Times cited : (29)

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