Comparison of electronic structures of mass-selected Ag clusters and thermally grown Ag islands on sputter-damaged graphite surfaces

Applied Physics A: Materials Science and Processing

Volumn 90, Issue 3, 2008, Pages 395-398

  Dietsche, R ^a   Lim, D C ^b   Bubek, M ^a   Lopez Salido, I ^a   Gantefor G ^a   Kim, Y D ^c  

^a UNIVERSITY OF KONSTANZ   (Germany)

^b Korea Institute of Material Science   (South Korea)

^c Sungkyunkwan University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC STRUCTURE; GRAPHITE; NEGATIVE IONS; SCANNING TUNNELING MICROSCOPY; SPUTTERING; X RAY PHOTOELECTRON SPECTROSCOPY;

ATOMIC OXYGEN; CLUSTER ANIONS; DEPOSITION ENERGY; SOFT-LANDING TECHNIQUE;

SILVER;

EID: 38549119643     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s00339-007-4344-7     Document Type: Article

References (25)

1. B. Yoon, H. Häkkinen, U. Landman, A.S. Wörz, J.M. Antonietti, S. Abbet, K. Judai, U. Heiz, Science 307, 403 (2005)
2. K. Judai, S. Abbet, A.S. Wörz, U. Heiz, C.R. Henry, J. Am. Chem. Soc. 126, 2732 (2004)
3. A.S. Wörz, K. Judai, S. Abbet, U. Heiz, J. Am. Chem. Soc. 125, 7964 (2003)
4. U. Heiz, A. Sanchez, S. Abbet, W.-D. Schneider, J. Am. Chem. Soc. 121, 3214 (1999)
5. U. Heiz, F. Vanolli, A. Sanchez, W.-D. Schneider, J. Am. Chem. Soc. 120, 9668 (1998)
6. S. Lee, C.Y. Fan, T.P. Wu, S.L. Anderson, J. Chem. Phys. 123, 124710 (2005)
7. X. Tong, L. Benz, P. Kemper, H. Metiu, M.T. Bowers, S.K. Buratto, J. Am. Chem. Soc. 127, 13516 (2007)
8. I. Lopez-Salido, D.C. Lim, Y.D. Kim, Surf. Sci. 588, 6 (2005)
9. D.C. Lim, I. Lopez-Salido, Y.D. Kim, Surf. Sci. 598, 96 (2005)
10. I. Lopez-Salido, D.C. Lim, R. Dietsche, N. Bertram, Y.D. Kim, J. Phys. Chem. B 110, 1128 (2006)
11. D.C. Lim, I. Lopez-Salido, R. Dietsche, M. Bubek, Y.D. Kim, Surf. Sci. 600, 507 (2006)
12. S.G. Hall, M.B. Nielsen, R.E. Palmer, J. Appl. Phys. 83, 733 (1998)
13. S.J. Carroll, S.G. Hall, R.E. Palmer, R. Smith, Phys. Rev. Lett. 81, 3715 (1998)
14. S.J. Carroll, S. Pratontep, M. Streun, R.E. Palmer, S. Hobday, R. Smith, J. Chem. Phys. 113, 7723 (2000)
15. S. Gibilisco, M. Di Vece, S. Palomba, G. Faraci, R.E. Palmer, J. Chem. Phys. 125, 084704 (2006)
16. M. Di Vece, S. Palomba, R.E. Palmer, Phys. Rev. B 72, 073407 (2005)
17. D.C. Lim, R. Dietsche, M. Bubek, T. Ketterer, G. Ganteför, Y.D. Kim, Chem. Phys. Lett. 439, 364 (2007)
18. H. Haberland, M. Mall, M. Moseler, Y. Qiang, T. Reiners, Y. Thurner, J. Vac. Sci. Technol. A 12, 2925 (1994)
19. V.I. Bukhtiyarov, A.F. Carley, L.A. Dollard, M.W. Roberts, Surf. Sci. 381, L605 (1997)
20. A. Sandell, J. Libuda, P.A. Brühwiler, S. Andersson, A.J. Maxwell, M. Bäumer, N. Mårtensson, H.J. Freund, J. Vac. Sci. Technol. A 14, 1546 (1996)
21. H. Hövel, T. Becker, A. Bettac, B. Reihl, M. Tschudy, E.J. Williams, J. Appl. Phys. 81, 154 (1997)
22. S.H. Jeong, D.C. Lim, J.-H. Boo, S.B. Lee, H.N. Hwang, C.C. Hwang, Y.D. Kim, Appl. Catal. A 320, 152 (2007)
23. H. Häkkinen, M. Moseler, U. Landman, Phys. Rev. Lett. 89, 033401 (2002)
24. B. Richter, H. Kuhlenbeck, H.-J. Freund, P.S. Bagus, Phys. Rev. Lett. 93, 026805 (2004)
25. A.N. Obraztsov, A.P. Volkov, A.I. Boronin, S.V. Kosheev, Diam. Relat. Mater. 11, 813 (2002)