SCOPUS 정보 검색 플랫폼

Optics Letters

Volumn 32, Issue 14, 2007, Pages 1971-1973

High-resolution line-scanning optical coherence microscopy

(4) Chen, Yu a Huang, Shu Wei a Aguirre, Aaron D a Fujimoto, James G a

a USA (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INCOHERENT SCATTERING; LINE-SCAN CCD CAMERA;

INTERFEROMETERS; LIGHT SCATTERING; OPTICAL RESOLVING POWER; OPTICAL TOMOGRAPHY; SAPPHIRE; TITANIUM ALLOYS;

OPTICAL SYSTEMS;

ALUMINUM OXIDE; TITANIUM;

ARTICLE; COLON; EQUIPMENT DESIGN; HUMAN; LASER; METHODOLOGY; MICROSCOPY; OPTICAL COHERENCE TOMOGRAPHY; OPTICS; PATHOLOGY; PHASE CONTRAST MICROSCOPY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY;

ALUMINUM OXIDE; COLON; EQUIPMENT DESIGN; HUMANS; LASERS; MICROSCOPY, INTERFERENCE; MICROSCOPY, VIDEO; OPTICS; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; TITANIUM; TOMOGRAPHY, OPTICAL COHERENCE;

EID: 38449112058 PISSN: 01469592 EISSN: None Source Type: Journal
DOI: 10.1364/OL.32.001971 Document Type: Article

Times cited : (50)

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