Enhanced weak-signal sensitivity in two-photon microscopy by adaptive illumination

Optics Letters

Volumn 32, Issue 19, 2007, Pages 2846-2848

  Chu, Kengyeh K ^a   Lim, Daryl ^a   Mertz, Jerome ^a  

^a Boston University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DETECTION POWER; ILLUMINATION POWER; IMAGE SATURATION; LASER SCANNING OPTICAL MICROSCOPE;

FEEDBACK CONTROL; FLUORESCENCE MICROSCOPY; LIGHTING; PHOTONS; SENSITIVITY ANALYSIS;

OPTICAL MICROSCOPY;

ALGORITHM; ARTICLE; COMPUTER ASSISTED DIAGNOSIS; FEEDBACK SYSTEM; ILLUMINATION; IMAGE ENHANCEMENT; METHODOLOGY; MULTIPHOTON MICROSCOPY; SENSITIVITY AND SPECIFICITY;

ALGORITHMS; FEEDBACK; IMAGE ENHANCEMENT; IMAGE INTERPRETATION, COMPUTER-ASSISTED; LIGHTING; MICROSCOPY, FLUORESCENCE, MULTIPHOTON; SENSITIVITY AND SPECIFICITY;

EID: 38449103260     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.32.002846     Document Type: Article

References (5)