Half-lives and intensities of X-ray and γ-ray emission of 113Sn, 117mSn, and 119mSn

Radiochemistry

Volumn 45, Issue 6, 2003, Pages 537-541

  Popov, Yu S ^a   Zakharova, L V ^a   Kupriyanov, V N ^a   Andreev, O I ^a   Vakhetov, V Z ^a   Toporov, Yu G ^a  

^a RESEARCH INSTITUTE OF ATOMIC REACTORS   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

TIN;

ARTICLE; DIAGNOSTIC ACCURACY; DRUG HALF LIFE; GAMMA SPECTROMETRY; IMAGE INTENSIFIER; IMAGE PROCESSING; ISOTOPE LABELING; NUCLEAR PHYSICS; RADIATION SCATTERING; RADIOCHEMISTRY; RELIABILITY; SEMICONDUCTOR; X RAY;

EID: 3843152602     PISSN: 10663622     EISSN: None     Source Type: Journal    
DOI: 10.1023/B:RACH.0000015746.20441.ad     Document Type: Article

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