Thermal stress analysis for the meander-shape YBCO fault current limiter

Physica C: Superconductivity and its Applications

Volumn 411, Issue 1-2, 2004, Pages 25-31

  Takashima, Hideyoshi ^a   Sasaki, Ken Ichi ^a   Onishi, Toshitada ^a  

^a HOKKAIDO UNIVERSITY   (Japan)

Author keywords

Bulk high Tc superconductor; Superconducting fault current limiter; Thermal stress analysis

Indexed keywords

COMPUTER SIMULATION; CURRENT DENSITY; ELECTRIC FAULT CURRENTS; FINITE ELEMENT METHOD; STRESS ANALYSIS; SUPERCONDUCTING MATERIALS; THERMAL STRESS;

CURRENT DISTRIBUTION; SUPERCONDUCTING FAULT CURRENT LIMITERS; VOLTAGE DROP;

LIMITERS;

EID: 3843151414     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physc.2004.03.248     Document Type: Article

References (11)

1. Noe M., Juengst K.-P., Werfel F., Cowey L., Wolf A., Elschner S. IEEE Trans. Appl. Supercond. 11(1):2001;1960.
2. Tixador P., Porcar L., Floch E., Buzon D., Isfort D., Bourgault D., Chaud X., Tournier R. IEEE Trans. Appl. Supercond. 11(1):2001;2034.
3. Gromoll B., et al. IEEE Trans. Appl. Supercond. 7(2):1997;828.
4. c superconducting fault current limiter Supercond. Sci. Technol. 10:1997;914.
5. Onishi T., Sasaki K.-i., Akimoto R. Cryogenics. 41:2001;239.
6. Leung E., Burley B., Chiwood N., Gurol H., Miyata G., Morris D., Ngyuen L., O'Hea B., et al. IEEE Trans. Appl. Supercond. 10(1):2000;832.
7. Tekletsadik K., Saravolac M.P., Rowley A. IEEE Trans. Appl. Supercond. 9(9):1999;672.
8. Tixador P., et al. Inst. Phys. Conf. Ser. 167:1999;949.
9. W. Paul, et al., Superconducting fault current limiter applications, technical and economical benefits, simulations and test results, CIGRE Session, 2000, 13.
10. Miyamoto T., Nagashima K., Sakai N., Murakami M. Supercond. Sci. Technol. 13:2000;816.
11. Murakami M., Morita M., Doi K., Miyamoto K. Jpn. J. Appl. Phys. 28:1989;1189.