Characterization of a wavelength-tunable surface plasmon resonance microscope

Review of Scientific Instruments

Volumn 75, Issue 7, 2004, Pages 2300-2304

  Fu, Elain ^a   Chinowsky, Timothy ^b   Foley, Jennifer ^a   Weinstein, Joshua ^a   Yager, Paul ^a  

^a University of Washington   (United States)

^b University of Washington   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DYNAMIC RANGE; IMAGING WAVELENGTH; INTERFERENCE FILTERS; OPTIMAL IMAGING;

APPROXIMATION THEORY; CAMERAS; CHARGE COUPLED DEVICES; IMAGING TECHNIQUES; LIGHT POLARIZATION; REFRACTIVE INDEX; ROTATION; SENSITIVITY ANALYSIS; SIGNAL PROCESSING; SIGNAL TO NOISE RATIO; SPECKLE; SURFACE PLASMON RESONANCE;

OPTICAL MICROSCOPY;

EID: 3843143817     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1764608     Document Type: Article

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