메뉴 건너뛰기




Volumn 5376, Issue PART 1, 2004, Pages 352-359

Reactive dissolution kinetics of lithographic copolymers

Author keywords

Critical ionization; Kinetics; Quartz crystal microbalance; Resist dissolution

Indexed keywords

CRITICAL IONIZATION; QUARTZ CRYSTAL MICROBALANCE; RESIST DISSOLUTION;

EID: 3843125195     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.535599     Document Type: Conference Paper
Times cited : (17)

References (12)
  • 4
    • 0141499970 scopus 로고    scopus 로고
    • Advances in resist technology and processing XX
    • F. A. Houle, W. D. Hinsberg and M. I. Sanchez, Advances in Resist Technology and Processing XX, SPIE Vol 5039, 334 (2003).
    • (2003) SPIE , vol.5039 , pp. 334
    • Houle, F.A.1    Hinsberg, W.D.2    Sanchez, M.I.3
  • 5
    • 0036140088 scopus 로고    scopus 로고
    • W. D. Hinsberg, S. W. Lee, K. K. Kanazawa, Anal. Chem. 74, 125 (2002); W. D. Hinsberg, S. W. Lee, D. Horne, K. K. Kanazawa, SPIE Adv. Resist Technol. Proc. XVIII, 4345, 1 (2001).
    • (2002) Anal. Chem. , vol.74 , pp. 125
    • Hinsberg, W.D.1    Lee, S.W.2    Kanazawa, K.K.3
  • 10
    • 3843049575 scopus 로고    scopus 로고
    • F. A. Houle and W. D. Hinsberg, in preparation (2004)
    • F. A. Houle and W. D. Hinsberg, in preparation (2004).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.