-
3
-
-
0024777596
-
-
J. Knoth, H. Schwenke, and U. Weisbrod, Spectrochim. Acta, Part B 44, 477 (1989).
-
(1989)
Spectrochim. Acta
, vol.44
, Issue.PART B
, pp. 477
-
-
Knoth, J.1
Schwenke, H.2
Weisbrod, U.3
-
4
-
-
0038768074
-
Depth profile analysis
-
R. K. Marcus and J. A. C. Broekaert, Eds. (John Wiley and Sons, Chichester), Chap. 5
-
A. Bengston, "Depth Profile Analysis", in Glow Discharge Plasmas in Analytical Spectroscopy, R. K. Marcus and J. A. C. Broekaert, Eds. (John Wiley and Sons, Chichester, 2003), Chap. 5.
-
(2003)
Glow Discharge Plasmas in Analytical Spectroscopy
-
-
Bengston, A.1
-
5
-
-
0041875114
-
Surfaces, thin films and coatings
-
R. K. Marcus and J. A. C. Broekaert, Eds. (John Wiley and Sons, Chichester), Chap. 8
-
R. Payling P. Chapon, K. Shimizu, R. Passetemps, A. Jadin, Y. Bourgeois, K. Crener, M. Aeberhard, and J. Michler, "Surfaces, Thin Films and Coatings", in Glow Discharge Plasmas in Analytical Spectroscopy, R. K. Marcus and J. A. C. Broekaert, Eds. (John Wiley and Sons, Chichester, 2003), Chap. 8.
-
(2003)
Glow Discharge Plasmas in Analytical Spectroscopy
-
-
Payling, R.1
Chapon, P.2
Shimizu, K.3
Passetemps, R.4
Jadin, A.5
Bourgeois, Y.6
Crener, K.7
Aeberhard, M.8
Michler, J.9
-
6
-
-
3843118228
-
Comparison of glow discharge atomic spectrometry with other surface analytical methods
-
R. K. Marcus and J. A. C. Broekaert, Eds. (John Wiley and Sons, Chichester), Chap. 9
-
K. Wagatsuma, "Comparison of Glow Discharge Atomic Spectrometry with Other Surface Analytical Methods", in Glow Discharge Plasmas in Analytical Spectroscopy, R. K. Marcus and J. A. C. Broekaert, Eds. (John Wiley and Sons, Chichester, 2003), Chap. 9.
-
(2003)
Glow Discharge Plasmas in Analytical Spectroscopy
-
-
Wagatsuma, K.1
-
8
-
-
0036868209
-
-
L. M. He, K. Putyera, J. D. Meyer, L. R. Walker, and W. Y. Lee, Metall. Mater. Trans. A 33, 3578 (2002).
-
(2002)
Metall. Mater. Trans. A
, vol.33
, pp. 3578
-
-
He, L.M.1
Putyera, K.2
Meyer, J.D.3
Walker, L.R.4
Lee, W.Y.5
-
9
-
-
0034493198
-
-
L. A. De las Heras, O. L. Actis-Dato, M. Betti, E. H. Toscano, U. Tocci, R. Fuocco, and S. Giannarelli, Microchem. J. 67, 333 (2000).
-
(2000)
Microchem. J.
, vol.67
, pp. 333
-
-
De las Heras, L.A.1
Actis-Dato, O.L.2
Betti, M.3
Toscano, E.H.4
Tocci, U.5
Fuocco, R.6
Giannarelli, S.7
-
14
-
-
3843114989
-
New trends in Rutherford backscattering spectrometry
-
P. Chakraborty, Ed. (Nova Science, New York)
-
E. J. Knystautas, "New Trends in Rutherford Backscattering Spectrometry", in Ion Beam Analysis of Surfaces and Interfaces of Condensed Matter Systems, P. Chakraborty, Ed. (Nova Science, New York, 2003), p. 59.
-
(2003)
Ion Beam Analysis of Surfaces and Interfaces of Condensed Matter Systems
, pp. 59
-
-
Knystautas, E.J.1
-
17
-
-
0002770910
-
Sample preparation for ICP-MS
-
K. E. Jarvis, A. L. Gray, and R. S. Houk, Eds. (Blackie, London), Chap. 7
-
I. Jarvis, "Sample Preparation for ICP-MS", in Handbook of ICP-MS, K. E. Jarvis, A. L. Gray, and R. S. Houk, Eds. (Blackie, London, 1992), Chap. 7.
-
(1992)
Handbook of ICP-MS
-
-
Jarvis, I.1
-
18
-
-
3843048641
-
Etching
-
and A. O. Benscoter, "Carbon and Alloy Steels", (ASM International), 169-173
-
G. Petzow and G. Elssner, "Etching", and A. O. Benscoter, "Carbon and Alloy Steels", in ASM Handbook: Metallography and Microstructures (ASM International, 1985), vol. 9, pp. 60-63, 169-173.
-
(1985)
ASM Handbook: Metallography and Microstructures
, vol.9
, pp. 60-63
-
-
Petzow, G.1
Elssner, G.2
-
19
-
-
0034269456
-
-
A. Krushevzka, S. Tan, M. Passer, and X. R. Liu, J. Anal. At. Spectrom. 15, 1211 (2000).
-
(2000)
J. Anal. At. Spectrom.
, vol.15
, pp. 1211
-
-
Krushevzka, A.1
Tan, S.2
Passer, M.3
Liu, X.R.4
-
21
-
-
0042012717
-
-
A. Danel, T. Lardin, C. Giroud, and F. Tardif, Mater. Sci. Eng., B 102, 213 (2003).
-
(2003)
Mater. Sci. Eng., B
, vol.102
, pp. 213
-
-
Danel, A.1
Lardin, T.2
Giroud, C.3
Tardif, F.4
-
22
-
-
0041930988
-
-
M. B. Shabani, Y. Shiina, F. G. Kirscht, and Y. Shimanuki, Mater. Sci. Eng., B 102, 238 (2003).
-
(2003)
Mater. Sci. Eng., B
, vol.102
, pp. 238
-
-
Shabani, M.B.1
Shiina, Y.2
Kirscht, F.G.3
Shimanuki, Y.4
-
24
-
-
0031496134
-
-
V. O. Schmitt, J. Szupunar, O. F. X. Donard, and R. Lobinski, Can. J. Anal. Sci. Spectrosc. 42, 41 (1997).
-
(1997)
Can. J. Anal. Sci. Spectrosc.
, vol.42
, pp. 41
-
-
Schmitt, V.O.1
Szupunar, J.2
Donard, O.F.X.3
Lobinski, R.4
-
26
-
-
0028496738
-
-
I. Feldmann, W. Tittes, N. Jakubowski, D. Stuewer, and U. Giessmann, J. Anal. At. Spectrom. 9, 1007 (1994).
-
(1994)
J. Anal. At. Spectrom.
, vol.9
, pp. 1007
-
-
Feldmann, I.1
Tittes, W.2
Jakubowski, N.3
Stuewer, D.4
Giessmann, U.5
-
28
-
-
3242770450
-
Elemental speciation by ICP-MS with high resolution instruments
-
R. Cornelis, J. A. Caruso, H. M. Crews, and K. Heumann, Eds. (John Wiley and Sons, Chichester), Chap. 5.7
-
R. S. Houk, "Elemental Speciation by ICP-MS with High Resolution Instruments", in Handbook of Elemental Speciation, Techniques and Methodology, R. Cornelis, J. A. Caruso, H. M. Crews, and K. Heumann, Eds. (John Wiley and Sons, Chichester, 2003), Chap. 5.7.
-
(2003)
Handbook of Elemental Speciation, Techniques and Methodology
-
-
Houk, R.S.1
|