Numerical simulation and experimental verification of the piezoresistivity phenomenon for the printed thick-film piezoresitors

Proceedings of the 5th International Conference on Thermal and Mechanical Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2004

Volumn , Issue , 2004, Pages 359-366

  Wymyslowski A ^a   Santo Zarnik, M ^b,c   Friedel, K ^a   Belavic D ^b,c  

^a WROCLAW UNIVERSITY OF TECHNOLOGY   (Poland)

^b JO EF STEFAN INSTITUTE   (Slovenia)

^c HIPOT   (Slovenia)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; COMPUTER SIMULATION; MATRIX ALGEBRA; PARTIAL DIFFERENTIAL EQUATIONS; PIEZOELECTRICITY; RESISTORS; STRAIN; STRESSES; THICK FILMS;

PIEZORESISTIVITY; PRESSURE SENSORS; PRINTED THICK FILM PIEZORESISTORS;

MICROELECTRONIC PROCESSING;

EID: 3843119866     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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