Application of a static quadrupole deviator to the deposition of size-selected cluster ions from a laser vaporization source

Review of Scientific Instruments

Volumn 75, Issue 7, 2004, Pages 2461-2470

  Alayan, R ^a   Arnaud, L ^a   Bourgey, A ^a   Broyer, M ^a   Cottancin, E ^a   Huntzinger, J R ^a   Lerme J ^a   Vialle, J L ^a   Pellarin, M ^a   Guiraud, G ^b  

^a Laboratoire de Spectrometrie Ionique et Moleculaire   (France)

^b Lab Phys Matiere Cond N   (France)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; COMPUTER SIMULATION; DEPOSITION; DISPERSIONS; ELECTRIC FIELDS; ELECTROMETERS; ELECTROSTATIC DEVICES; KINETIC ENERGY; NANOSTRUCTURED MATERIALS; NEODYMIUM LASERS; PHOTOIONIZATION; QUANTUM THEORY; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

ELECTROSTATIC QUADRUPOLE DEVIATORS; FULL WIDTH AT HALF MAXIMUM (FWHM); MASS FILTERS; NANOPARTICLES;

LASER BEAM EFFECTS;

EID: 3843100283     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1764607     Document Type: Article

References (33)

1. A. Pérez, P. Mélinon, V. Dupuis, B. Prevel, L. Bardotti, J. Tuaillon-Combes, B. Masenelli, M. Treilleux, M. Pellarin, J. Lermé, E. Cottancin, M. Broyer, M. Jamet, M. Négrier, F. Toumus, and M. Gaudry, Mat. Trans. 42, 1460 (2001).
2. H. Hofmeister, S. Grosse, G. Gerth, and H. Haefke, Nanostruct. Mater. 6, 529 (1995).
3. H. Brune, M. Giovarmini, K. Bromann, and K. Kern, Nature (London) 394, 451 (1998).
4. R. Andres, J. Bielefeld, J. Henderson, D. Janes, V. Kolanguta, C. Kubniak, W. Mahoney, and R. Osifchin, Science 273, 1690 (1996).
5. S. A. Harfenist, Z. L. Wang, R. L. Whetten, I. Vezmar, and M. M. Alvarez, Adv. Mater. (Weinheim, Ger.) 9, 817 (1997).
6. N. Pinna, M. Maillard, A. Courty, V. Russier, and M. P. Pileni, Phys. Rev. B 66, 045415 (2002).
7. J. M. Soler, N. Garcia, O. Echt, K. Sattler, and E. Recknagel, Phys. Rev. Lett. 49, 1857 (1982).
8. R. B. Huang, Q. Zhang, H. Chen, and L. S. Zheng, Eur. Phys. J. D 9, 253 (1999).
9. S. Yamamuro, K. Sumiyama, and K. Suzuki, J. Appl. Phys. 85, 483 (1999).
10. M. Ehbrecht, B. Kohn, F. Huisken, M. A. Laguna, and V. Paillard, Phys. Rev. B 56, 6958 (1997).
11. G. Tikhonov, K. Wong, V. Kasperovich, and V. V. Kresin, Rev. Sci. Instrum. 73, 1204 (2002).
12. W. Harbich, S. Ferdigo, F. Meyer, D. M. Lindsay, J. Lignières, J. C. Rivoal, and D. Kreisle, J. Chem. Phys. 93, 8535 (1990).
13. S. Wolf, G. Sommerer, S. Rutz, E. Schreiber, T. Leisner, L. Wöste, and R. S. Berry, Phys. Rev. Lett. 74, 4177 (1995).
14. C. Félix, C. Sieber, W. Harbich, J. Buttet, I. Rabin, W. Schulze, and G. Ertl, Phys. Rev. Lett. 86, 2992 (2001).
15. U. Heiz and W. D. Schneider, J. Phys. D 33, R85 (2000).
16. P. M. Denby and D. A. Eastham, Appl. Phys. Lett. 79, 2477 (2001).
17. D. A. Eastham, B. Hamilton, and P. M. Denby, Nanotechnology 13, 51 (2002).
18. B. Wrenger and K. H. Meiwes-Broer, Rev. Sci. Instrum. 68, 2027 (1997).
19. B. von Issendorf and R. E. Palmer, Rev. Sci. Instrum. 70, 4497 (1999).
20. H. Wollnik, J. Mass Spectrom. 34, 991 (1999).
21. W. Yamaguchi, K. Yoshimura, Y. Tai, Y. Maruyama, K. Igarashi, S. Tane-mura, and J. Murakami, Chem. Phys. Lett. 311, 341 (1999).
22. P. M. Denby and D. A. Eastham, Nucl. Instrum. Methods Phys. Res. A 441, 588 (2000).
23. R. T. Laaskonen, D. A. Goetsch, D. W. Owens, D. M. Poirier, F. Stepniak, and J. H. Weaver, Rev. Sci. Instrum. 65, 2267 (1994).
24. H. D. Zeeman, Rev. Sci. Instrum. 48, 1079 (1977).
25. D. A. Dahl, SIMION 3D Version 7.0, Bechtel BWXT Idaho LLC, Idaho National Engineering and Environmental Laboratory, P.O. Box 1625, Idaho Falls, ID 83415.
26. U. Zimmermann, N. Malinowski, U. Näher, S. Franck, and T. P. Martin, Z. Phys. D 31, 85 (1994).
27. M. Broyer, B. Cabaud, A. Hoareau, P. Mélinon, D. Rayane, and B. Tri-bollet, Mol. Phys. 62, 559 (1987).
28. J. F. Roux, B. Cabaud, G. Fuchs, D. Guillot, A. Hoareau, and P. Mélinon, Appl. Phys. Lett. 64, 1212 (1994).
29. Since the particle diameter varies as the cubic root of the mass or the number of atoms, the corresponding relative dispersions are three times smaller.
30. T. Itoh, T. Asashi, and H. Mashuara, Appl. Phys. Lett. 79, 1667 (2001).
31. T. Klar, M. Ferner, S. Grosse, G. Von Plessen, W. Spirkl, and J. Feldman, Phys. Rev. Lett. 80, 4249 (1998).
32. N. Nilius, N. Ernst, and H. J. Freund, Phys. Rev. Lett. 84, 3994 (2000).
33. M. Jamet, W. Wernsdorfer, C. Thirion, D. Mailly, V. Dupuis, P. Mélinon, and A. Perez, Phys. Rev. Lett. 86, 4676 (2001).