Long memory testing in the time domain

Econometric Theory

Volumn 24, Issue 1, 2008, Pages 176-215

  Demetrescu, Matei ^a   Kuzin, Vladimir ^a   Hassler, Uwe ^a  

^a GOETHE UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 38349141531     PISSN: 02664666     EISSN: 14694360     Source Type: Journal    
DOI: 10.1017/S0266466608080092     Document Type: Article

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