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Volumn 24, Issue 1, 2008, Pages 22-25
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Cryo-fracture TEM: Direct imaging of a random mesh phase
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Author keywords
[No Author keywords available]
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Indexed keywords
NONIONIC SURFACTANTS;
PHASE STRUCTURE;
TRANSMISSION ELECTRON MICROSCOPY;
LAMELLAR PHASE;
MESH STRUCTURE;
PERFORATED SURFACTANT BILAYERS;
RANDOM MESH PHASE;
TRANSMISSION MODE;
IMAGE ANALYSIS;
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EID: 38349116779
PISSN: 07437463
EISSN: None
Source Type: Journal
DOI: 10.1021/la703443c Document Type: Article |
Times cited : (6)
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References (16)
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