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Volumn 24, Issue 1, 2008, Pages 22-25

Cryo-fracture TEM: Direct imaging of a random mesh phase

Author keywords

[No Author keywords available]

Indexed keywords

NONIONIC SURFACTANTS; PHASE STRUCTURE; TRANSMISSION ELECTRON MICROSCOPY;

EID: 38349116779     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la703443c     Document Type: Article
Times cited : (6)

References (16)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.