Characterization of the surface changes and the aging effects of low-pressure nitrogen plasma treatment in a polyurethane film

Polymer Testing

Volumn 27, Issue 1, 2008, Pages 75-83

  Sanchis, M R ^a   Calvo, O ^a   Fenollar, O ^b   Garcia, D ^b   Balart, R ^b  

^a Instituto Tecnológico Textil   (Spain)

^b UNIVERSITAT POLITÈCNICA DE VALÈNCIA   (Spain)

Author keywords

Atomic force microscopy (AFM); Contact angle; Low pressure plasma; Polyurethane film; Surface modification; X ray photoelectron spectroscopy (XPS)

Indexed keywords

ATOMIC FORCE MICROSCOPY; CONTACT ANGLE; ETCHING; HYDROPHOBICITY; PLASMA INTERACTIONS; POLYURETHANES; SCANNING ELECTRON MICROSCOPY; WETTING; X RAY PHOTOELECTRON SPECTROSCOPY;

LOW PRESSURE PLASMA TREATMENT; PARTIAL HYDROPHOBIC RECOVERY; PLASMA TREATED FILMS; POLYURETHANE FILMS;

POLYMER FILMS;

EID: 38149119576     PISSN: 01429418     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.polymertesting.2007.09.002     Document Type: Article

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