Made-to-measure pattern development based on 3D whole body scans

International Journal of Clothing Science and Technology

Volumn 20, Issue 1, 2008, Pages 15-25

  Daanen, Hein ^a,b   Hong, Sung Ae ^c  

^a TNO   (Netherlands)

^b VU UNIVERSITY AMSTERDAM   (Netherlands)

^c Hansung University   (South Korea)

Author keywords

Clothing; Dimensional measurement; Image scanners

Indexed keywords

CLOTHING; DESIGN/METHODOLOGY/APPROACH; DIMENSIONAL MEASUREMENTS; DIRECT CONVERSION; IMAGE SCANNER; MANUFACTURING TECHNIQUES; MASS CUSTOMIZATION; WHOLE BODY SCANNER;

MATERIALS SCIENCE;

THREE DIMENSIONAL;

BODY SCANNING; FIT; JEANS; PATTERN (CONFIGURATION); SKIRT;

EID: 38149114133     PISSN: 09556222     EISSN: 17585953     Source Type: Journal    
DOI: 10.1108/09556220810843502     Document Type: Article

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