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Volumn 4680 LNCS, Issue , 2007, Pages 93-99

Combining static/dynamic fault trees and event trees using Bayesian networks

Author keywords

[No Author keywords available]

Indexed keywords

COMBINATORIAL MATHEMATICS; FAULT TREE ANALYSIS; MARKOV PROCESSES; TREES (MATHEMATICS);

EID: 38149109894     PISSN: 03029743     EISSN: 16113349     Source Type: Book Series    
DOI: None     Document Type: Conference Paper
Times cited : (13)

References (11)
  • 5
    • 9444266483 scopus 로고    scopus 로고
    • A discrete-time Bayesian network reliability modeling and analysis framework
    • Boudali, H., Dugan, J.B.: A discrete-time Bayesian network reliability modeling and analysis framework. Reliability Engineering and System Safety 87, 337-349 (2005)
    • (2005) Reliability Engineering and System Safety , vol.87 , pp. 337-349
    • Boudali, H.1    Dugan, J.B.2
  • 9
    • 0030245278 scopus 로고    scopus 로고
    • A linear time algorithm to find modules of fault trees
    • Dutuit, Y., Rauzy, A.: A linear time algorithm to find modules of fault trees. IEEE Transactions on Reliability 45, 422-425 (1996)
    • (1996) IEEE Transactions on Reliability , vol.45 , pp. 422-425
    • Dutuit, Y.1    Rauzy, A.2
  • 11
    • 33746182045 scopus 로고
    • Analysis in Hugin of data conflict
    • Bonissone, P.P, Henrion, M, Kanal, L.N, Lemmer, J.F, eds, Elsevier Science Publishers, Amsterdam, The Netherlands
    • Jensen, F.V., Chamberlain, B., Nordahl, T., Jensen, F.: Analysis in Hugin of data conflict. In: Bonissone, P.P., Henrion, M., Kanal, L.N., Lemmer, J.F. (eds.) Uncertainty in Artificial Intelligence, vol. 6, pp. 519-528. Elsevier Science Publishers, Amsterdam, The Netherlands (1991)
    • (1991) Uncertainty in Artificial Intelligence , vol.6 , pp. 519-528
    • Jensen, F.V.1    Chamberlain, B.2    Nordahl, T.3    Jensen, F.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.