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Volumn 11, Issue 3, 2007, Pages 309-320

Investigation of in-flight particle characteristics and microstructural effects on optical properties of YSZ plasma-sprayed coatings

Author keywords

In flight particle diagnostics; Plasma spraying; Scattering and absorption coefficients; Transmittance

Indexed keywords

COATINGS; MICROSTRUCTURE; THERMAL BARRIER COATINGS; THERMOANALYSIS; YTTRIA STABILIZED ZIRCONIA;

EID: 38149095626     PISSN: 10933611     EISSN: None     Source Type: Journal    
DOI: 10.1615/HighTempMatProc.v11.i3.10     Document Type: Article
Times cited : (15)

References (10)
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    • 0032073179 scopus 로고    scopus 로고
    • Analysis of Thermal Radiation Effects on Temperature in Turbine Engine Thermal Barrier Coatings
    • R. Siegel and C.M. Spuckler, Analysis of Thermal Radiation Effects on Temperature in Turbine Engine Thermal Barrier Coatings, Materials Science and Engineering, 1998, A245, pp. 150-159.
    • (1998) Materials Science and Engineering , vol.A245 , pp. 150-159
    • Siegel, R.1    Spuckler, C.M.2
  • 3
    • 0001354948 scopus 로고
    • On-Line Control of the Plasma Spraying Process by Monitoring the Temperature, Velocity and Trajectory of In-Flight Particles
    • C.C. Berndt and S. Sampath, Ed, June 20-24, Boston, pp
    • C. Moreau, P. Gougeon, M. Lamontagne, V. Lacasse, G. Vaudreuil and P. Cielo, On-Line Control of the Plasma Spraying Process by Monitoring the Temperature, Velocity and Trajectory of In-Flight Particles, Proceedings of the 7th National Thermal Spray Conference, C.C. Berndt and S. Sampath, Ed., June 20-24, 1994, Boston, pp. 431-437.
    • (1994) Proceedings of the 7th National Thermal Spray Conference , pp. 431-437
    • Moreau, C.1    Gougeon, P.2    Lamontagne, M.3    Lacasse, V.4    Vaudreuil, G.5    Cielo, P.6
  • 4
    • 38149076878 scopus 로고    scopus 로고
    • V. Debout, A. Vardelle, E. Meillot, P. Abélard, E. Bruneton, P. Fauchais et al., Correlation between Processing Parameters, Microstructure and Optical Properties for Plasma-Sprayed Yttria-Stabilized Zirconia Coatings, 17th International Symposium on Plasma chemistry, J. Mostaghimi et al., Ed., Univ. of Toronto Press, Pub., August 7-12, 2005, Toronto, Canada.
    • V. Debout, A. Vardelle, E. Meillot, P. Abélard, E. Bruneton, P. Fauchais et al., Correlation between Processing Parameters, Microstructure and Optical Properties for Plasma-Sprayed Yttria-Stabilized Zirconia Coatings, 17th International Symposium on Plasma chemistry, J. Mostaghimi et al., Ed., Univ. of Toronto Press, Pub., August 7-12, 2005, Toronto, Canada.
  • 7
    • 0019617852 scopus 로고
    • The Relationship between the Mechanism of Formation, Microstructure and Properties of Plasma-Sprayed Coatings
    • R. MacPherson, The Relationship between the Mechanism of Formation, Microstructure and Properties of Plasma-Sprayed Coatings, Thin Solid Films, 1981, 83, pp. 173-181.
    • (1981) Thin Solid Films , vol.83 , pp. 173-181
    • MacPherson, R.1
  • 8
    • 30644473885 scopus 로고    scopus 로고
    • In Situ Measurement System for Deformation and Solidification Phenomena of Yttria-Stabilized Zirconia Droplets Impinging on Quartz Glass Substrate under Plasma-Spraying Conditions
    • K. Shinoda, Y. Kojima and T. Yoshiba, In Situ Measurement System for Deformation and Solidification Phenomena of Yttria-Stabilized Zirconia Droplets Impinging on Quartz Glass Substrate under Plasma-Spraying Conditions, Journal of Thermal Spray Technology, 2005, 14(4), pp. 511-517.
    • (2005) Journal of Thermal Spray Technology , vol.14 , Issue.4 , pp. 511-517
    • Shinoda, K.1    Kojima, Y.2    Yoshiba, T.3
  • 9
    • 0021515410 scopus 로고
    • Four Flux Models to Solve the Scattering Transfer Equation in terms of Lorentz Mie Parameters
    • B. Maheu, J.N. Toulouzian and G. Gouesbet, Four Flux Models to Solve the Scattering Transfer Equation in terms of Lorentz Mie Parameters, Applied Optics, 1984, 23(19), pp. 3353-3362.
    • (1984) Applied Optics , vol.23 , Issue.19 , pp. 3353-3362
    • Maheu, B.1    Toulouzian, J.N.2    Gouesbet, G.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.