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Volumn 53, Issue 2, 2008, Pages 473-485

Use of an amorphous silicon EPID for measuring MLC calibration at varying gantry angle

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; OPTICAL COLLIMATORS; PATIENT TREATMENT; PIXELS; PORTALS; QUALITY CONTROL;

EID: 38049169060     PISSN: 00319155     EISSN: 13616560     Source Type: Journal    
DOI: 10.1088/0031-9155/53/2/013     Document Type: Article
Times cited : (36)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.