Enhancement of exchange bias by ultra-thin Mn layer insertion at the interface of Mn-Ir/Co-Fe bilayers

Physica Status Solidi (B) Basic Research

Volumn 244, Issue 12, 2007, Pages 4470-4473

  Tsunoda, M ^a   Yoshitaki, S ^a   Ashizawa, Y ^a,d   Kim, D Y ^a,b   Mitsumata, C ^a,c   Takahashi, M ^a  

^a TOHOKU UNIVERSITY   (Japan)

^b Chungnam National University   (South Korea)

^c HITACHI CABLE LTD   (Japan)

^d NIHON UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 38049148557     PISSN: 03701972     EISSN: 15213951     Source Type: Journal    
DOI: 10.1002/pssb.200777391     Document Type: Conference Paper

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