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Volumn 4694 LNAI, Issue PART 3, 2007, Pages 243-250
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A kernel based learning by sample technique for defect identification through the inversion of a typical electric problem
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Author keywords
Electromagnetic inverse problems; Non destructive testing and evaluation; Support vector regression machines
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Indexed keywords
ELECTROSTATICS;
INSPECTION;
PROBLEM SOLVING;
RISK ASSESSMENT;
ELECTROMAGNETIC INVERSE PROBLEMS;
NON DESTRUCTIVE TESTING;
SUPPORT VECTOR REGRESSION MACHINES;
SUPPORT VECTOR MACHINES;
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EID: 38049125667
PISSN: 03029743
EISSN: 16113349
Source Type: Book Series
DOI: 10.1007/978-3-540-74829-8_30 Document Type: Conference Paper |
Times cited : (2)
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References (13)
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