Probing the intrapore surface of phenyl-substituted nanoscale mesoporous silica - Piezoelectric sorption measurements in thin films

Langmuir

Volumn 23, Issue 26, 2007, Pages 12915-12922

  Darga, Alexander ^a   Kecht, Johann ^a   Bein, Thomas ^a  

^a UNIVERSITY OF MUNICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DYNAMIC LIGHT SCATTERING; MESOPOROUS MATERIALS; QUARTZ CRYSTAL MICROBALANCES; RAMAN SPECTROSCOPY; SORPTION; SUBSTITUTION REACTIONS; THERMOGRAVIMETRIC ANALYSIS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; VAN DER WAALS FORCES; VOLATILE ORGANIC COMPOUNDS;

COULOMB FORCES; MESOPOROUS SILICA; SURFACE-AFFINITY;

SILICA;

EID: 38049114893     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la701962b     Document Type: Article

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