Pattern classification of nevus with texture analysis

IEEJ Transactions on Electrical and Electronic Engineering

Volumn 3, Issue 1, 2008, Pages 143-150

  Tanaka, Toshiyuki ^a   Torii, Satoru ^a   Kabuta, Iukei ^a   Shimizu, Kunio ^a   Tanaka, Masaru ^a  

^a KEIO UNIVERSITY   (Japan)

Author keywords

Nevus; Pattern classification; Texture analysis

Indexed keywords

DISCRIMINANT ANALYSIS; HOSPITALS; SKIN; TEXTURES; TUMORS;

DIGITAL IMAGES; GLOBULAR PATTERN; SCREENING SYSTEM; TEXTURE ANALYSIS;

PATTERN RECOGNITION;

EID: 38049103824     PISSN: 19314973     EISSN: 19314981     Source Type: Journal    
DOI: 10.1002/tee.20246     Document Type: Article

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