An X-ray diffraction method to determine stress at constant penetration/information depth

Materials Science Forum

Volumn 524-525, Issue , 2006, Pages 13-18

  Kumar, A ^a   Welzel, U ^a   Wohlschloge, M ^a   Baumann, W ^a   Mittemeijer, E J ^a  

^a UNIVERSITY OF STUTTGART   (Germany)

Author keywords

Information depth; Penetration depth; Stress gradient

Indexed keywords

DEPOSITION; ERRORS; NICKEL; SPUTTERING; STRESS ANALYSIS;

INFORMATION DEPTH; PENETRATION DEPTH; STRESS GRADIENT;

X RAY DIFFRACTION;

EID: 38049091209     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/0-87849-414-6.13     Document Type: Conference Paper

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