A run-based two-scan labeling algorithm

Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)

Volumn 4633 LNCS, Issue , 2007, Pages 131-142

  He, Lifeng ^a,c,d   Chao, Yuyan ^b,d   Suzuki, Kenji ^c  

^a AICHI PREFECTURAL UNIVERSITY   (Japan)

^b NAGOYA SANGYO UNIVERSITY   (Japan)

^c UNIVERSITY OF CHICAGO   (United States)

^d SHAANXI UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

Author keywords

Connected components; Label equivalence; Labeling algorithm; Linear time algorithm; Pattern recognition; Run data

Indexed keywords

EQUIVALENCE CLASSES; IMAGE PROCESSING; PATTERN RECOGNITION; PIXELS;

CONNECTED COMPONENTS; LABEL EQUIVALENCE; LABELING ALGORITHM; LINEAR-TIME ALGORITHM; RUN DATA;

ALGORITHMS;

EID: 37849035765     PISSN: 03029743     EISSN: 16113349     Source Type: Book Series    
DOI: 10.1007/978-3-540-74260-9_12     Document Type: Conference Paper

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