Realization of a phase noise measurement bench using cross correlation and double optical delay line

Acta Physica Polonica A

Volumn 112, Issue 5, 2007, Pages 1107-1111

  Salzenstein, P ^a   Cussey, J ^a   Jouvenceau, X ^a   Tavernier, H ^a   Larger, L ^a   Rubiola, E ^a   Sauvage, G ^b  

^a FEMTO ST INSTITUTE   (France)

^b Aeroflex   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC DELAY LINES; MICROWAVE DEVICES; SAPPHIRE; SIGNAL NOISE MEASUREMENT;

CROSS CORRELATION; DOUBLE OPTICAL DELAY LINE; PHASE NOISE MEASUREMENT; X-BAND;

PHASE NOISE;

EID: 37849027013     PISSN: 05874246     EISSN: None     Source Type: Journal    
DOI: 10.12693/APhysPolA.112.1107     Document Type: Conference Paper

References (3)

1. E. Rubiola, E. Salik, S. Huang, N. Yu, L. Maleki, J. Opt. Soc. Am. B 22, 987 (2005).
2. X.S. Yao, L. Maleki, J. Opt. Soc. Am. B 13, 1725 (1996).
3. E. Rubiola, R. Boudot, IEEE Trans. Ultrasonics, Ferroelectrics, Frequency Control 54, 926 (2007).