Evolution of escape processes with a time-varying load

Physical Review E - Statistical Physics, Plasmas, Fluids, and Related Interdisciplinary Topics

Volumn 66, Issue 3, 2002, Pages

  Choi, Mee H ^a   Fox, Ronald F ^a  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EIGENSPECTRUM; ESCAPE PROCESSES; NOISY PARTICLES; TIME-VARYING LOADS;

COMPUTER SIMULATION; EIGENVALUES AND EIGENFUNCTIONS; ELECTRIC LOADS; PERTURBATION TECHNIQUES; QUANTUM THEORY; SPECTRUM ANALYSIS; SPURIOUS SIGNAL NOISE;

TIME VARYING SYSTEMS;

ARTICLE;

EID: 37649032120     PISSN: 1063651X     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevE.66.031103     Document Type: Article

References (9)

1. C.W. Gardiner, Handbook of Stochastic Methods (Springer-Verlag, Berlin, 1989).
2. H. Risken, The Fokker-Planck Equation (Springer-Verlag, Berlin, 1989).
3. H.C. Tuckwell, Introduction to Theoretical Neurobiology (Cambridge University Press, Cambridge, 1988), Vol. 2.
4. R.F. Fox and M.H. Choi, Phys. Rev. E 63, 051901 (2001).
5. R.F. Fox and P. Jung, Phys. Rev. A 57, 2339 (1998).
6. A.R. Bulsara, T.C. Elston, C.R. Doering, S.B. Lowen, and K. Lindenberg, Phys. Rev. E 53, 3958 (1996).
7. M.H. Choi, R.F. Fox, and P. Jung, Phys. Rev. E 57, 6335 (1998).
8. J.E. Fletcher, S. Havlin, and G.H. Weiss, J. Stat. Phys. 51, 215 (1988).
9. F. Haake, Quantum Signatures of Chaos (Springer-Verlag, Berlin, 1991).