First-order interface localization-delocalization transition in thin Ising films using Wang-Landau sampling

Physical Review E - Statistical, Nonlinear, and Soft Matter Physics

Volumn 71, Issue 4, 2005, Pages

  Schulz, B J ^a   Binder, K ^a   Muller M ^b  

^a JOHANNES GUTENBERG UNIVERSITY   (Germany)

^b University of Wisconsin Madison   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DENSITY OF STATES (DOS); THIN ISING FILMS; WANG-LANDAU SAMPLING; WETTING TEMPERATURE;

COMPUTER SIMULATION; FREE ENERGY; INTERFACES (MATERIALS); MAGNETIZATION; MATHEMATICAL MODELS; MONTE CARLO METHODS; PROBABILITY DISTRIBUTIONS; THERMODYNAMICS;

THIN FILMS;

EID: 37649031174     PISSN: 15393755     EISSN: 15502376     Source Type: Journal    
DOI: 10.1103/PhysRevE.71.046705     Document Type: Article

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