ZnO:Er(III) Nanosystems analyzed by XPS

Surface Science Spectra

Volumn 13, Issue 1-4, 2006, Pages 9-16

  Armelao, Lidia ^a   Barreca, Davide ^b   Bottaro, Gregorio ^b   Gasparotto, Alberto ^b   Leonarduzzi, Daniele ^b   Maragno, Cinzia ^b   Tondello, Eugenio ^b  

^a CNR   (Italy)

^b UNIVERSITY OF PADOVA   (Italy)

Author keywords

Nanosystems; Rf sputtering; Sol gel; ZnO:Er(III)

Indexed keywords

CHEMICAL COMPOSITIONS; EX SITU; GLANCING INCIDENCE X-RAY DIFFRACTIONS; RF-SPUTTERING; XPS ANALYSIS; ZNO;

ATOMIC FORCE MICROSCOPY; ERBIUM; PHOTOELECTRONS; SECONDARY ION MASS SPECTROMETRY; SOL-GEL PROCESS; SOL-GELS; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY; ZINC; ZINC OXIDE;

NANOSYSTEMS;

EID: 37649004537     PISSN: 10555269     EISSN: 15208575     Source Type: Journal    
DOI: 10.1116/11.20060301     Document Type: Article

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