Transmission electron microscopy observations on Cu-Mg alloy systems

Solid State Phenomena

Volumn 127, Issue , 2007, Pages 103-108

  Nishikawa, Ken Ichi ^a   Semboshi, Satoshi ^a   Konno, Toyohiko J ^a  

^a Osaka Prefecture University   (Japan)

Author keywords

Age hardening; Cu Mg alloy; Laves phase; Precipitation

Indexed keywords

AGE HARDENING; ANNEALING; ELECTRIC CONDUCTIVITY; PRECIPITATION (CHEMICAL); TRANSMISSION ELECTRON MICROSCOPY; VICKERS HARDNESS;

LAVES PHASE; STRUCTURAL CHANGES;

COPPER ALLOYS;

EID: 37549040495     PISSN: 10120394     EISSN: None     Source Type: Book Series    
DOI: 10.4028/3-908451-33-7.103     Document Type: Conference Paper

References (9)

1. P. Liu, B. X. Kang, X. G. Cao, J. L. Huang, H. C. Gu: J. Mater. Sci, Vol.35 (2000), p. 1691
2. Y. Sakai, H.-J. Schneider-muntau: Acta mater. Vol.45 (1997), p.1017
3. David E., Laughlin, John W. Cahn: Acta mater. Vol.23 (1975), p.329
4. Lockyer Sa., Noble FW.: J. Mater. Sci. Vol.29 (1994), p.218
5. R. Chaim, J. Pelleg, M, Talianker: J. Mater. Sci. Vol.22 (1987), p.1609
6. H. Tsubakino, R. Nozato: J. Mater: Sci. Vol.19 (1984), p.3013
7. H. Tsubakino, R. Nozato, A.Yamamoto: Mater. Characterization Vol.29 (1992), p.7
8. F. Sommer, G. Bucher, B. Predel: J. Phys. Colloque, Vol.C8-41 (1980), p.563
9. T. Takahashi, T. Yamane. Y. Minamino, T. Kimura: J. Mater. Sci. Vol.8 (1989), p.882