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Volumn 130, Issue , 2007, Pages 7-14

Applications of high-resolution powder X-ray diffraction

Author keywords

High throughput; In Situ studies; Powder X ray diffraction; Strain measurements; Structural analysis; Synchrotron radiation

Indexed keywords

CRYSTALLINE MATERIALS; STRAIN MEASUREMENT; SYNCHROTRON RADIATION;

EID: 37549025450     PISSN: 10120394     EISSN: None     Source Type: Book Series    
DOI: 10.4028/3-908451-40-x.7     Document Type: Conference Paper
Times cited : (4)

References (27)
  • 3
    • 84902906920 scopus 로고    scopus 로고
    • Information on http://www.esrf.fr/exp_facilities/BM1A/index.htm
    • Information on http://www.esrf.fr/exp_facilities/BM1A/index.htm
  • 5
    • 84902920478 scopus 로고    scopus 로고
    • J. Wright, G. Vaughan and A. Fitch: IUCr Computing Commission Newsletter, No. 1 (2003) p. 92; on http://www.iucr.org/iucr-top/comm/ccom/newsletters/ 2003jan/index.html
    • J. Wright, G. Vaughan and A. Fitch: IUCr Computing Commission Newsletter, No. 1 (2003) p. 92; on http://www.iucr.org/iucr-top/comm/ccom/newsletters/ 2003jan/index.html
  • 21
    • 0004295610 scopus 로고    scopus 로고
    • available via
    • J.F. Bérar: Program XND, available via ftp://ftp.grenoble.cnrs.fr/ xnd/
    • Program XND
    • Bérar, J.F.1
  • 25
    • 0035249470 scopus 로고    scopus 로고
    • P.J. Withers and P.J. Webster: Strain 37 (2001) p.19
    • P.J. Withers and P.J. Webster: Strain Vol. 37 (2001) p.19


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.