Searching for asses, finding a kingdom: The story of the invention of the scanning tunnelling microscope (STM)

Annals of Science

Volumn 65, Issue 1, 2008, Pages 101-125

  Granek, Galina ^a   Hon, Giora ^a  

^a UNIVERSITY OF HAIFA   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

KNOWLEDGE ACQUISITION; PRODUCT DEVELOPMENT; PROJECT MANAGEMENT;

SCANNING TUNNELLING MICROSCOPES;

MICROSCOPES;

EID: 37549016425     PISSN: 00033790     EISSN: 1464505X     Source Type: Journal    
DOI: 10.1080/00033790701458769     Document Type: Article

References (89)

1. H.C. Von Baeyer, Taming the Atom. The Emergence of the Visible Microworld (New York, 2000);
2. A. Hessenbruch, 'Interview: Gerd Binnig and Heinrich Rohrer', in Binnig's office at IBM Zurich, Rüschlikon, 13:30-15:30, 4 May 2001 (3) in A. Hessenbruch, A short history of Scanning Probe Microscopy', Dibner's 'History of Recent Science and Technology' at: http://hrst.mit.edu/hrs/materials/public/ STM, 2001;
3. J. Schummer and A. Nordmann, eds., Discovering the Nanoscale (Amsterdam, 2004);
4. Arne Hessenbruch, 'Nanotechnology and the Negotiation of Novelty', in Schummer and Nordmann, 135-44;
5. D. Baird and A. Shew, 'Probing the History of Scanning Tunneling Microscopy', in Schummer and Nordmann, 145-56;
6. J. Hennig, 'Changing in the Design of Scanning Tunneling Microscopic Images from 1980 to 1990', Techné 8 (2004), 1-20;
7. C.M. Mody, Crafting the Tools of Knowledge the Invention, Spread, and Commercialization of Probe Microscopy, 1960-2000 (Dissertation, Cornell University, 2004);
8. C. Mody, 'How Probe Microscopists became Nanotechnologists', in Schummer and Nordmann, 119-33;
9. C. Robinson, 'Images in Nanoscience Technology', in Schummer and Nordmann, 165-69;
10. J.C. Pitt, 'The Epistemology of the Very Small', in Schummer and Nordmann, 157-63;
11. J.Z. Buchwald, 'How the Ether Spawned the Microworld', in L. Daston, ed., Biographies of Scientific Objects (Chicago, 2000), 203-25.
12. A5 #643 397, Gesuchsnummer: 8486/79; Raster-Tunnelmikroskop, Erfinder: G. Binnig, Richterswil, H. Rohrer, Richterswil, Schweizerisch-liechtensteinischer Patentschutzvertrag vom 22. Dezember 1978. US patent #4,343,993 for the Scanning Tunneling Microscope invented by G. Binnig and H. Rohrer, registered on 10 August 1982 (filed 12 September 1980). Since both patents, the Swiss and the American, are almost identical, all citations are taken from, the American (English) version of the patent disclosure.
13. G. Binnig and H. Rohrer, 'Scanning Tunneling Microscopy', IBM Journal of Research and Development 30 (1986), 355-69 (358).
14. G. Binnig and H. Rohrer, 'Scanning Tunneling Microscopy-From. Birth to Adolescence', Nobel lecture, Reviews of Modern Physics 59 (1987), 615-25 (615). The Nobel, lecture was delivered on 8 December 1986.
15. Ibid., 616.
16. B.M. Schawrzschild, 'Microscopy by Vacuum Tunneling', Physics Today 35 (April 1982), 21-22 (22).
17. Ibid., 21.
18. H-J. Rheinberger, Towards a History of Epistemic Things: Synthesizing Proteins in the Test Tube (Stanford, 1997).
19. M. Hagner, and H.-J. Rheinberger, 'Experimental Systems, Objects of Investigation, and Spaces of Representation', in M. Heidelberger and F. Steinle, eds., Experimental Essays - Versuche zum Experiment (Baden-Baden, 1998), 355-73.
20. F. Steinte, 'Entering New Fields: Exploratory Uses of Experimentation', Philosophy of Science 64 (Supplement 1997), S65-S74;
21. F. Steinle, (1998), 'Exploratives vs. theoriebestimmtes Experimentieren: Ampères erste Arbeiten zum Elektromagnetismus', ibid, Heidelberger and Steinle (1998), 272-97.
22. G. Hon, 'Towards a typology of experimental errors: An epistemological view', Studies in History and Philosophy of Science 20 (1989), 469-504;
23. G. Hon, '"If This Be Error": Probing Experiment With Error', note 8, Heidelberger and Steinle (1998), 227-48.
24. Note 4, 615.
25. Ibid.
26. A. Hessenbruch, 'interview: Gerd Binnig and Heinrich Rohrer', note 1.
27. Note 2, 2.
28. Note 2, 12.
29. Note 2, 1.
30. G. Binnig and C. Gerber, 'Piezo Drive with Coarse and Fine Adjustment', IBM Technical Disclosure Bulletin 22 (1979), 2897; note 2, sheet 2 of 3.
31. Note 2, 4.
32. Note 2, 6.
33. Private communication, H. Rohrer, 2 April 2006; note 2, 5; Binnig and Rohrer called their machine at the end of 1978, 'Raster-Tunnelmikroskop'.
34. Note 4, 616-17.
35. Note 6, 21.
36. See note 17.
37. Note 2, 2.
38. G. Binnig, H. Rohrer, C. Gerber, and E. Weibel, 'Tunneling Through a Controllable Vacuum Gap', Applied Physics Letters 40 (1982), 178-80 (178) (received 30 September 1981).
39. Note 4, 618.
40. G. Binnig, H. Rohrer, C. Gerber, and E. Weibel, 'Vacuum Tunneling', Physica 109 and 110B (1982), 2075-2077 (originally a talk, 19-25 August 1981) (2075). For the second paper, see note 25.
41. A. Hessenbruch, 'Interview: Gerd Binnig and Heinrich Rohrer', note 1, 4.
42. Note 4, 619.
43. Ibid, 615.
44. For the LT16 Conference lecture, see note 27; it was published in 1982.
45. G. Binnig, H. Rohrer, C. Gerber, and E. Weibel, 'Surface Studies by Scanning Tunneling Microscopy', Physical Review Letters 49 (1982), 57-61 (58-59) (received 30 April 1982).
46. Note 2, 2.
47. Note 25, 178.
48. Note 32, 59.
49. Note 4, 619.
50. Note 32, 57-60.
51. G. Binnig and H. Rohrer, 'Scanning Tunneling Microscopy', Surface Science 126 (1983), 236-44 (received 30 September 1982).
52. G. Binnig and H. Rohrer, 'Scanning Tunneling Microscopy', Helvetica Physica Acta 55 (1982), 726-35 (received 30 December 1982).
53. Note 3, 358.
54. A. Hessenbruch, 'Interview: Gerd Binnig and Heinrich Rohrer', note 1, 2.
55. ibid., 3.
56. Ibid.
57. Ibid.
58. Ibid.
59. Note 25, 179.
60. Note 27, 2077.
61. Note 2, 4.
62. Ibid., 1.
63. Ibid. For the original German, see note 2, 2-3 (patent 1978): 'Bei einer Abbildung der Oberfläche mit gleich-energetischer Strahlung spricht man von Mikroskopie. Im Falle einer Untersuchung mit Strahlung unterschiedlicher Spannung oder Frequenz, d.h. mit variierender Energie, spricht man im allgemeinen von Spektroskopie. Dennoch nennt man die Geräte meist Mikroskope, auch wenn sie zusätzlich spektroskopische Untersuchungen ermöglichen'.
64. Ibid., 9.
65. Ibid.
66. Note 25, 178.
67. G. Binnig, H. Rohrer, C. Gerber, and E. Stoll, 'Real-Space Observation of the Reconstruction of Au(100)', Surface Science 144 (1984), 321-35 (325).
68. Ibid.
69. Note 38, 734.
70. Ibid.
71. Ibid.
72. Ibid.
73. Note 4, 623.
74. Note 2, 12.
75. C.F. Quate, 'Vacuum Tunneling: A. New Technique for Microscopy', Physics Today (August 1986), 26-33.
76. H. Rohrer, private communication to the authors, 20 September 2006. Low Energy Electron Diffraction (LEED) is a technique used to characterize the structures of surfaces (see also Figure 5, caption).
77. G. Binnig, H. Fuchs, C Gerber, O. Marti and H. Rohrer, 'Scanning Tunneling Microscope combined with a scanning electron microscope', Review of Scientific Instruments 57 (1986), 221-24 (221) (received 17 July 1985).
78. Note 62.
79. Gerd Binnig and Heinrich Rohrer, 'The Scanning Tunneling Microscope', Scientific American 253 (1985), 40-46 (on 40).
80. A.M. Baro, G. Binnig, H, Rohrer, E. Stoll, A. Baratoff, and F. Salvan, 'Real-Space Observation of the 2 x 1 Structure of Chemisorbed Oxygen on Ni(110) by Scanning Tunneling Microscopy', Physical Review Letters 52 (1984), 1304-1307 (1305).
81. N. Garcia, ed., 'STM'86 Proceedings of the First International. Conference on Scanning Tunneling Microscopy' (14-18 July 1986, Santiago de Compostela, Spain), Surface Science 181 (1987).
82. Note 4, 617.
83. Note 62.
84. Note 63, 221.
85. Note 32.
86. Note 32, 58-59; cf. note 35.
87. Note 4, 618.
88. Note 20.
89. 'The Creative Process', an interview with Gerd Binnig, Deutschland Forum on Politics, Culture and Business, No. 5 (October/November 2004), 46-47 (47).