Rotating dual-wire beam profile monitor optimized for use in merged-beams experiments

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 585, Issue 1-2, 2008, Pages 69-75

  Seely, D G ^a   Bruhns, H ^b   Savin, D W ^b   Kvale, T J ^c   Galutschek, E ^d   Aliabadi, H ^d   Havener, C C ^d  

^a ALBION COLLEGE   (United States)

^b Och Spine at New York Presbyterian Hospitals   (United States)

^c UNIVERSITY OF TOLEDO   (United States)

^d OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

Beam profile monitor; Beam scanner; Merged beams; Overlap; Rotating wire

Indexed keywords

ANGLE MEASUREMENT; OPTIMIZATION; SCANNING;

BEAM AXIS; BEAM PROFILE MONITORS; BEAM SCANNERS; MERGED BEAMS; ROTATING WIRES;

PARTICLE BEAMS;

EID: 37549009091     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2007.10.041     Document Type: Article

References (17)

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13. C.C. Havener, R. Al-Rejoub, United States Patent 6972551, UT-Batelle, LLC, Oak Ridge, TN.
14. National Electrostatics Corporation, Middleton, WI 53562-0310.
15. National Electrostatics Corporation Instruction Manual for Model BPM80 Beam Profile Monitor.
16. National Electrostatics Corporation current amplifier, Model 2HA003090, provided with the BPM80 Beam Profile Monitor system.
17. {ring operator} relative to the xy coordinate frame, this distance projected onto either the x or y axis is π r / sqrt(2). For the BPM80 scanner, the scanning circle radius r = 2.7 cm, which gives a calibration distance of 6.0 cm between the first and third fiducial positions.