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Volumn 602, Issue 1, 2008, Pages 142-150

TDAB-induced DNA plasmid condensation on the surface of a reconstructed boron doped silicon substrate

Author keywords

Atomic force microscopy; DNA surfactants; Langmuir Blodgett Kuhn assemblies; Nanopatterning

Indexed keywords

ATOMIC FORCE MICROSCOPY; BORON; CONDENSATION; CROSSLINKING; DOPING (ADDITIVES); SILICON; SURFACE ACTIVE AGENTS;

EID: 37549008692     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2007.09.058     Document Type: Article
Times cited : (6)

References (41)
  • 18
    • 37549034773 scopus 로고    scopus 로고
    • D. Briggs, M.P. Seah, Wiley, Chichester, 1983, p. 363.
  • 19
    • 37549047344 scopus 로고    scopus 로고
    • C.D. Wagner, W.M. Riggs, L.E. Davis, J.F. Moulder, G.E. Muilenberg, Perkin-Elmer Corporation, Eden Prairie, MN, 1979.
  • 32
    • 0000503141 scopus 로고
    • Quantification of AES and XPS
    • Briggs D., and Seah M.P. (Eds), John Wiley & Sons, Chichester, UK
    • Seah M.P. Quantification of AES and XPS. In: Briggs D., and Seah M.P. (Eds). Practical Surface Analysis. second ed. vol. 1 (1990), John Wiley & Sons, Chichester, UK
    • (1990) Practical Surface Analysis. second ed. , vol.1
    • Seah, M.P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.