Ray-based stochastic inversion: Improving reservoir characterization in a Gulf of Mexico field

SEG Technical Program Expanded Abstracts

Volumn 26, Issue 1, 2007, Pages 1775-1779

  van der Burg, Dennis ^a   Verdel, Arie ^b   Wapenaar, Kees ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b Shell EP Technology

Author keywords

[No Author keywords available]

Indexed keywords

EID: 37549006431     PISSN: 10523812     EISSN: None     Source Type: Book Series    
DOI: 10.1190/1.2792836     Document Type: Conference Paper

References (6)

1. Chen, J., and G. T. Schuster, 1999, Resolution limits of migrated images: Geophysics, 64, 1046-1053.
2. Levin, S. A., 1998, Resolution in seismic imaging: Is it all a matter of perspective?: Geophysics, 63, 743-749.
3. Toxopeus, G., S. Petersen, and K. Wapenaar, 2003, Improved geological modeling and interpretation by simulated migrated seismics: 73rd Annual International Meeting, SEG, Expanded Abstracts, 2445-2448.
4. Tygel, M., J. Schleicher, and P. Hubral, 1994, Pulse distortion in depth migration: Geophysics, 59, 1561-1569.
5. van der Burg, D., A. Verdel, and K. Wapenaar, 2005, Ray-based stochastic inversion for reservoir parameters using 1D convolutional forward modeling: 75th Annual International Meeting, SEG, Expanded Abstracts,1441-1444.
6. Verdel, A., D. van der Burg, and K. Wapenaar, 2004, Ray-based stochastic inversion: 66th Annual Conference and Exhibition, EAGE, Extended Abstracts, C031.