Linear feature extraction based on complex ridgelet transform

Wear

Volumn 264, Issue 5-6, 2008, Pages 428-433

  Jiang, Xiangqian ^a   Zeng, Wenhan ^a   Scott, Paul ^b   Ma, Jianwei ^a   Blunt, Liam ^a  

^a UNIVERSITY OF HUDDERSFIELD   (United Kingdom)

^b Taylor and Hobson Ltd   (United Kingdom)

Author keywords

Complex finite ridgelet transform; Finite Radon transform; Linear singularity; Shift invariance; Surface topography

Indexed keywords

NUMERICAL METHODS; PROBLEM SOLVING; SURFACE TOPOGRAPHY; WAVELET TRANSFORMS;

COMPLEX FINITE RIDGELET TRANSFORM; FINITE RADON TRANSFORM; LINEAR SINGULARITY; SHIFT INVARIANCE;

FEATURE EXTRACTION;

FEATURE EXTRACTION; NUMERICAL METHODS; PROBLEM SOLVING; SURFACE TOPOGRAPHY; WAVELET TRANSFORMS;

EID: 37449026720     PISSN: 00431648     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.wear.2006.08.040     Document Type: Article

References (13)

1. Chen X., Raja J., and Simanapalli S. Multi-scale analysis of engineering surfaces. Int. J. Mach. Tools Manufact. 35 (1995) 231-238
2. Lee S.H., Zahouani H., Caterini R., and Mathia T.G. Multi-scale analysis of engineering surfaces. Int. J. Mach. Tools Manufact. 38 (1998) 581-589
3. Jiang X., Blunt L., and Stout K.J. Development of a lifting wavelet representation for surface characterization. Proc. Roy. Soc. Lond. A 456 (2000) 1-31
4. Jiang X., and Blunt L. Morphological assessment of in vivo wear of orthopedic implants using multiscale wavelets. Wear 250 (2001) 217-221
5. Candès E.J., and Donoho D.L. Ridgelets: a key to higher-dimensional intermittency. Phil. Trans. Roy. Soc. Lond. A 357 (1999) 2495-2509
6. Donoho D.L. Orthonormal ridgelets and linear singularities. SIAM J. Math. Anal. 31 5 (2000) 1062-1099
7. Do M.N., and Vetterli M. The finite ridgelet transform for image representation. IEEE Trans. Image Process. 12 1 (2003) 16-28
8. Kingsbury N. Image processing with complex wavelets. Phil. Trans. Roy. Soc. Lond. A 357 (1999) 2543-2560
9. Kingsbury N. Complex wavelets for shift invariant analysis and filtering of signals. Appl. Comput. Harmon. Anal. 10 3 (2001) 234-253
10. Jiang X., and Blunt L. Third generation wavelet for the extraction of morphological features from micro and nano scalar surfaces. Wear 25 (2004) 1235-1240
11. Zeng W., Jiang X., and Scott P. Metrological characteristics of dual tree complex wavelet transform for surface analysis. Meas. Sci. Technol. 16 (2005) 1410-1417
12. Bolker E.D. The finite Radon transform. Contemp. Math. 63 (1987) 27-50
13. Matus F., and Flusser J. Image representation via a finite Radon transform. IEEE Trans. Pattern Anal. Mach. Intell. 15 10 (1993) 996-1006