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Volumn 20, Issue 12, 2007, Pages 24-28

Advancing defect containment to quantitative defect management

Author keywords

[No Author keywords available]

Indexed keywords

DEFECT CONTAINMENT MEASURE; EARLY DEFECT CAPTURE TECHNIQUES; QUANTITATIVE DEFECT MANAGEMENT;

EID: 37449018598     PISSN: None     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (11)

References (8)
  • 1
    • 0004254702 scopus 로고    scopus 로고
    • 2nd ed. Prentice Hall
    • Yourdon, E. Death March. 2nd ed. Prentice Hall, 2003.
    • (2003) Death March
    • Yourdon, E.1
  • 5
    • 37449022419 scopus 로고    scopus 로고
    • SEI. Capability Maturity Model Integration. Version 1.2. Carnegie Mellon, SEI, 2006
    • SEI. Capability Maturity Model Integration. Version 1.2. Carnegie Mellon, SEI, 2006.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.