Differential isothermal capacitance transient spectroscopy for the studies of deep levels in semiconductors

Review of Scientific Instruments

Volumn 68, Issue 5, 1997, Pages 2116-2120

  Suno, K ^a   Yoshino, J ^a   Okamoto, Y ^a   Morimoto, J ^a   Miyakawa, T ^a  

^a NATIONAL DEFENSE ACADEMY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 3743150926     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1148105     Document Type: Article

References (7)

1. D. V. Lang, J. Appl. Phys. 45, 3023 (1974).
2. H. Okusi and Y. Tokumaru, Jpn, J. Appl. Phys. 19, L335 (1980).
3. H. Okushi and Y. Tokumaru, Jpn. J. Appl. Phys. 20-1, 261 (1981).
4. P. Omling, L. Samuelson, and H. Grimmeiss, J. Appl. Phys. 54, 5117 (1983).
5. M. Fudamoto, J. Morimoto, K. Tahira, and T. Miyakawa, Mem. Natl. Def. Acad. Jpn. 28, 105 (1988).
6. J. Morimoto, M. Fudamoto, K. Tahira, T. Kida, S. Kato, and T. Miyakawa, Jpn. J. Appl. Phys. 26, 1634 (1987).
7. K. Tahira, J. Morimoto, and T. Miyakawa, Jpn. J. Appl. Phys. 27, 556 (1988).