Characterization of a new phase in WO3 thin films grown by sol-gel method

Materials Science Forum

Volumn 228-231, Issue PART 2, 1996, Pages 493-498

  Sangaletti, L ^a   Depero, L E ^a   Armelao, L ^b  

^a UNIVERSITY OF BRESCIA   (Italy)

^b UNIVERSITY OF PADOVA   (Italy)

Author keywords

Sol Gel; Structural Properties; Thin Films; WO3; X Ray Diffraction

Indexed keywords

CHARACTERIZATION; DEPOSITION; FILM GROWTH; MODELS; SOL-GELS; STRUCTURE (COMPOSITION); SYNTHESIS (CHEMICAL); THIN FILMS; X RAY DIFFRACTION;

CHEMICAL ROUTE; EDGE SHARING OCTAHEDRA; STRUCTURAL PROPERTIES;

TUNGSTEN COMPOUNDS;

EID: 3743132240     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: None     Document Type: Article

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