Low-frequency noise of the leakage current in undoped low-pressure chemical vapor deposited polycrystalline silicon thin-film transistors

Applied Physics Letters

Volumn 70, Issue 7, 1997, Pages 880-882

  Dimitriadis, C A ^a,b   Brini, J ^a   Kamarinos, G ^a  

^a ENSERG   (France)

^b ARISTOTLE UNIVERSITY OF THESSALONIKI   (Greece)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 3743129960     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.118239     Document Type: Article

References (11)

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