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Volumn 226, Issue , 1997, Pages 37-43

Ultrasonic time-frequency characterization of silicon wafers at elevated temperatures

Author keywords

[No Author keywords available]

Indexed keywords


EID: 3743119620     PISSN: 01608835     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article
Times cited : (5)

References (13)
  • 1
    • 0027277214 scopus 로고
    • Fiber-Optic Techniques for Generating and Detecting Ultrasonic Waves for Quantitative NDE
    • Burger, C.P., Schumacher, N.A., Duffer, C.E., and Knab, T.D. , 1993, " Fiber-Optic Techniques for Generating and Detecting Ultrasonic Waves for Quantitative NDE," Optics and Lasers in Engineering, Vol. 19, pp. 121-140.
    • (1993) Optics and Lasers in Engineering , vol.19 , pp. 121-140
    • Burger, C.P.1    Schumacher, N.A.2    Duffer, C.E.3    Knab, T.D.4
  • 4
    • 0030241294 scopus 로고    scopus 로고
    • Experimental Wavelet Analysis of Flexural Waves in Beams
    • Inoue, H., Kishimoto, K., and Shibuya, T., 1996, "Experimental Wavelet Analysis of Flexural Waves in Beams," Experimental Mechanics, Vol. 36(3), pp. 212-217.
    • (1996) Experimental Mechanics , vol.36 , Issue.3 , pp. 212-217
    • Inoue, H.1    Kishimoto, K.2    Shibuya, T.3
  • 5
    • 84952051486 scopus 로고
    • Time-Frequency Analysis of Dispersive Waves by Means of Wavelet Transform
    • Kishimoto, K., Inoue, H., Hamada, M. and Shibuya, T., 1995, "Time-Frequency Analysis of Dispersive Waves by Means of Wavelet Transform," Journal of Applied Mechanics, Vol. 62(4), pp. 841-846.
    • (1995) Journal of Applied Mechanics , vol.62 , Issue.4 , pp. 841-846
    • Kishimoto, K.1    Inoue, H.2    Hamada, M.3    Shibuya, T.4
  • 7
    • 0025623057 scopus 로고
    • Non-Invasive Process Temperature Monitoring Using Laser-Acoustic Techniques
    • IEEE Electronic Devices Society, Honolulu, Hawaii
    • Lee, Y.J., Chou, C.H., Khuri-Yakub, B.T., and Saraswat, K.C., 1990, "Non-Invasive Process Temperature Monitoring Using Laser-Acoustic Techniques," Proceedings, 1990 Symposium on VLSI Technology, IEEE Electronic Devices Society, Honolulu, Hawaii, pp. 105-106.
    • (1990) Proceedings, 1990 Symposium on VLSI Technology , pp. 105-106
    • Lee, Y.J.1    Chou, C.H.2    Khuri-Yakub, B.T.3    Saraswat, K.C.4
  • 8
    • 0010157968 scopus 로고
    • A Lamb Wave Temperature Sensor for Semiconductor Wafer Processing
    • D.O. Thompson and D.E. Chimenti, ed., Plenum Press, New York
    • Lu, Y., Moor, M.V., Queheillalt, D.T., and Wadley, H.N.G., 1994, "A Lamb Wave Temperature Sensor for Semiconductor Wafer Processing," Review of Progress in Quantitative Nondestructive Evaluation, D.O. Thompson and D.E. Chimenti, ed., Plenum Press, New York, Vol. 13a, pp. 509-516.
    • (1994) Review of Progress in Quantitative Nondestructive Evaluation , vol.13 A , pp. 509-516
    • Lu, Y.1    Moor, M.V.2    Queheillalt, D.T.3    Wadley, H.N.G.4
  • 9
  • 11
    • 0027262204 scopus 로고
    • A Laser Based Investigation of Higher-Order Modes in Transient Lamb Waves
    • Schumacher, N.A., Burger, C.P., and Gien, P.H., 1993, "A Laser Based Investigation of Higher-Order Modes in Transient Lamb Waves," Journal of the Acoustical Society of America, Vol. 93(5), pp. 2981-2984.
    • (1993) Journal of the Acoustical Society of America , vol.93 , Issue.5 , pp. 2981-2984
    • Schumacher, N.A.1    Burger, C.P.2    Gien, P.H.3
  • 12
    • 0040410821 scopus 로고
    • Frequency Based Analysis Methods for Laser generated and Detected Transient Lamb Waves in Plates
    • D.O. Thompson and D.E. Chimenti, ed., Plenum Press, New York
    • Schumacher, N.A. and Burger, C.P., 1994, "Frequency Based Analysis Methods for Laser generated and Detected Transient Lamb Waves in Plates," Review of Progress in Quantitative Nondestructive Evaluation, D.O. Thompson and D.E. Chimenti, ed., Plenum Press, New York, Vol. 13a, pp. 157-164.
    • (1994) Review of Progress in Quantitative Nondestructive Evaluation , vol.13 A , pp. 157-164
    • Schumacher, N.A.1    Burger, C.P.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.