|
Volumn 264-268, Issue PART 1, 1998, Pages 421-424
|
Gaseous etching for characterization of structural defects in silicon carbide single crystals
|
Author keywords
Characterization; Defects; Dislocations; Etching; Step Bunching; Transformation
|
Indexed keywords
CRYSTAL ORIENTATION;
DISLOCATIONS (CRYSTALS);
ETCHING;
HIGH TEMPERATURE EFFECTS;
PHASE TRANSITIONS;
SILICON CARBIDE;
SUBSTRATES;
STEP BUNCHING;
SEMICONDUCTING SILICON COMPOUNDS;
|
EID: 3743104892
PISSN: 02555476
EISSN: 16629752
Source Type: Book Series
DOI: 10.4028/www.scientific.net/msf.264-268.421 Document Type: Article |
Times cited : (35)
|
References (13)
|