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Volumn 264-268, Issue PART 1, 1998, Pages 421-424

Gaseous etching for characterization of structural defects in silicon carbide single crystals

Author keywords

Characterization; Defects; Dislocations; Etching; Step Bunching; Transformation

Indexed keywords

CRYSTAL ORIENTATION; DISLOCATIONS (CRYSTALS); ETCHING; HIGH TEMPERATURE EFFECTS; PHASE TRANSITIONS; SILICON CARBIDE; SUBSTRATES;

EID: 3743104892     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.264-268.421     Document Type: Article
Times cited : (35)

References (13)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.