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1
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3743145163
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A Parametric Study of a VLSI Plastic Package Subjected to Encapsulation, Moisture Absorption and Solder Reflow Process
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CHMT, Jan. submitted
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Liu, S. and Mei, Y. H., "A Parametric Study of A VLSI Plastic Package Subjected to Encapsulation, Moisture Absorption and Solder Reflow Process," IEEE Trans., CHMT, Jan. 1996 (submitted).
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IEEE Trans.
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Liu, S.1
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0029423289
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An Investigation to Popcorning Mechanisms for IC Plastic Packages: Defect Initiation
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March submitted
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Mei, Y. H., Liu, S., "An Investigation to Popcorning Mechanisms for IC Plastic Packages: Defect Initiation," Trans. of the ASME, J. of Electronical Packaging, March 1995 (submitted).
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Trans. of the ASME, J. of Electronical Packaging
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Mei, Y.H.1
Liu, S.2
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3
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0029373480
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Behaviors of Delaminated Plastic IC Packages Subjected to Encapsulation Cooling, Moisture Absorption and Wave Soldering
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Sept.
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Liu, S. and Mei, Y.H., "Behaviors of Delaminated Plastic IC Packages Subjected to Encapsulation Cooling, Moisture Absorption and Wave Soldering, " IEEE Trans. on CHMT, Part A, Vol. 18, No. 3, Sept. 1995, pp.634-645.
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IEEE Trans. on CHMT, Part A
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Liu, S.1
Mei, Y.H.2
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4
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0001678724
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An Investigation to Popcorning Mechanisms for IC Plastic Packages: EMC Cracking
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to appear
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Liu, S. and Mei, Y.H., " An Investigation to Popcorning Mechanisms for IC Plastic Packages: EMC Cracking, " The Int. J. of Microcircuits and Electronic Packaging, 1997 (to appear).
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The Int. J. of Microcircuits and Electronic Packaging
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Liu, S.1
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5
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0039385827
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The effect of delamination on the thermal deformation of plastic power packages by combined high temperature moiré/FEM approach
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Nov. 17-22, Atlanta
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Jiansen Zhu, Daqing Zou and Sheng Liu, "The effect of delamination on the thermal deformation of plastic power packages by combined high temperature moiré/FEM approach", ASME WAM, Symposium on Structural Analysis of Electronic Packaging and Fiber Optics, Nov. 17-22, Atlanta, 1996.
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ASME WAM, Symposium on Structural Analysis of Electronic Packaging and Fiber Optics
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Zhu, J.1
Zou, D.2
Liu, S.3
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6
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0030395136
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Viscoelastic analysis of IC package warpage
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ASME
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Yeung, T. S., and Yuen, M. M. F., "Viscoelastic analysis of IC package warpage," EEP-Vol. 17, Sensing, Modeling and Simulation in Emerging Electronic Packaging, ASME, 1996. pp101-107.
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Sensing, Modeling and Simulation in Emerging Electronic Packaging
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Yeung, T.S.1
Yuen, M.M.F.2
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7
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0026992462
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Predicted residual bow of thin plastic packages of integrated circuit devices
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Subir, E., "Predicted residual bow of thin plastic packages of integrated circuit devices," Journal of Electronic Packaging, Vol. 114, 1992, pp467-470.
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Journal of Electronic Packaging
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, pp. 467-470
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Subir, E.1
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8
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0027961270
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Accurate prediction of PQFP warpage
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Kelly, G., Lyden, C., Lawton., W., and Barrett, J., "Accurate prediction of PQFP warpage," 44th Electronic Component Conference, 1994, pp102-106.
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44th Electronic Component Conference
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Kelly, G.1
Lyden, C.2
Lawton, W.3
Barrett, J.4
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9
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0343371919
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Experimental validation and finite element simulation of a 64 lead TQFP and a 68 lead PLCC
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SEM
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Skipor, A. F., Baird, J., Jeffery, D., et al, "Experimental validation and finite element simulation of a 64 lead TQFP and a 68 lead PLCC," Experimental/Numerical Mechanics in Electronic Packaging, Vol. 1, SEM, 1997, pp145-154.
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Experimental/Numerical Mechanics in Electronic Packaging
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Skipor, A.F.1
Baird, J.2
Jeffery, D.3
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10
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3743109564
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Global/Local Thermal Deformation Study of Power Plastic Package by a Multipurpose Macro/Micro Moiré Interferometer
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Bellevue, Washington, June 2-4
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Zou, D., Zhu, J., Dai, F., Liu, S., and Guo, Y.,"Global/Local Thermal Deformation Study of Power Plastic Package by A Multipurpose Macro/Micro Moiré Interferometer," Abstract Proceedings of the SEM Spring Conference on Experimental Mechanics & Experimental/Numerical Mechanics in Electronic Packaging, Bellevue, Washington, June 2-4, 1997. pp13-14.
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Abstract Proceedings of the SEM Spring Conference on Experimental Mechanics & Experimental/Numerical Mechanics in Electronic Packaging
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Zou, D.1
Zhu, J.2
Dai, F.3
Liu, S.4
Guo, Y.5
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11
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0031368002
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Resolving Deformation Field near Corners and Interfaces by Phase Shifting Moiré Interferometry
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Dallas, November 16-21, to be published
-
Zou, D., He, X., Lu, M., Liu, S., Guo, Y., and Dai, F., "Resolving Deformation Field near Corners And Interfaces by Phase Shifting Moiré Interferometry," ASME Symposium on Applications of Experimental Mechanics to Electronic Packaging, Dallas, November 16-21, 1997 (to be published)
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ASME Symposium on Applications of Experimental Mechanics to Electronic Packaging
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Zou, D.1
He, X.2
Lu, M.3
Liu, S.4
Guo, Y.5
Dai, F.6
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12
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-
0031345509
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A Window Based Graphics Interface for Phase Shifting Analysis in Moiré Interferometry
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November 16-21, to be published
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He, X., Zou, D., Lu, M., Liu, S., Guo, Y., and Dai, F., "A Window Based Graphics Interface for Phase Shifting Analysis in Moiré Interferometry," ASME, Symposium on Applications of Experimental Mechanics to Electronic Packaging Dallas, November 16-21, 1997 (to be published)
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ASME, Symposium on Applications of Experimental Mechanics to Electronic Packaging Dallas
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He, X.1
Zou, D.2
Lu, M.3
Liu, S.4
Guo, Y.5
Dai, F.6
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13
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0003713904
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Springer-Verlag, NY
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Post, D., Han, B., and Ifju, P., "High Sensitivity Moiré: Experimental Analysis for Mechanics and Materials," Springer-Verlag, NY, 1993.
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High Sensitivity Moiré: Experimental Analysis for Mechanics and Materials
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Post, D.1
Han, B.2
Ifju, P.3
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14
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0346655065
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Hybrid Method for Strain/Stress Analysis in Electronic Packaging Using Moiré Interferometry and FEM
-
Baltimore, Maryland, June 6-8
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Guo, Y. and C.K. Lim, "Hybrid Method for Strain/Stress Analysis in Electronic Packaging Using Moiré Interferometry and FEM," SEM Spring Conference, Baltimore, Maryland, June 6-8, 1994.
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SEM Spring Conference
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Guo, Y.1
Lim, C.K.2
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15
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0027662512
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Solder Ball Connect (SBC) Assemblies under Thermal Loading: I. Deformation Measurement via Moiré Interferometry and Its Interpretation
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Sept.
-
Guo, Y., Lim, C. K., Chen, W. T. and Woychik, C. A., "Solder Ball Connect (SBC) Assemblies under Thermal Loading: I. Deformation Measurement via Moiré Interferometry and Its Interpretation," IBM J. of Research and Development, Vol. 37, No. 5, Sept. 1993, pp. 635-647.
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IBM J. of Research and Development
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Guo, Y.1
Lim, C.K.2
Chen, W.T.3
Woychik, C.A.4
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16
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0029231814
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Experimental Determination of Effective Coefficients of Thermal Expansion in Electronic Packaging
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Lahaina, Hawaii, March 26-30
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Guo, Y., "Experimental Determination of Effective Coefficients of Thermal Expansion in Electronic Packaging," ASME International, Intersociety Electronic Packaging Conference & Exhibition, Lahaina, Hawaii, March 26-30, 1995, pp. 1253-1258.
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ASME International, Intersociety Electronic Packaging Conference & Exhibition
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Guo, Y.1
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17
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0344951659
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High Temperature Deformation Analysis of High Density Interconnects and Packages by High Density Moiré Interferometry
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Nashville, by B. Han, D. Barker, and R. Mahajan, Tennessee, June 10-12
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Zhu, J. S., Zou, D., Dai, F., Liu, S. and Guo, Y., "High Temperature Deformation Analysis of High Density Interconnects and Packages by High Density Moiré Interferometry," SEM's VIII International Congress on Experimental Mechanics, Experimental/Numerical Mechanics in Electronic Packaging, Nashville, Vol. 1, by B. Han, D. Barker, and R. Mahajan, Tennessee, June 10-12, 1996, pp. 229-234.
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SEM's VIII International Congress on Experimental Mechanics, Experimental/Numerical Mechanics in Electronic Packaging
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Zhu, J.S.1
Zou, D.2
Dai, F.3
Liu, S.4
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18
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0344951662
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Thermal Mechanical Behavior of Electronic Packaging Material by High Temperature Moiré Interferometry
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Shanghai, P. R. China, Dec. 9-12
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Zou, D., Zhu, J. S., Dai, F. and Liu, S. "Thermal Mechanical Behavior of Electronic Packaging Material by High Temperature Moiré Interferometry," The Second International Symposium, on Electronic Packaging Technology, Shanghai, P. R. China, Dec. 9-12, 1996, pp. 229-234..
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The Second International Symposium, on Electronic Packaging Technology
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Zou, D.1
Zhu, J.S.2
Dai, F.3
Liu, S.4
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19
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0344951663
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Temperature Dependent Mapping and Modeling Verification of Thermomechanical deformation in Plastic Packaging Structure Using Moiré Interferometry
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Dai, X., Kim, C., Willecke, R., Poon, T., and Ho, P., Temperature Dependent Mapping and Modeling Verification of Thermomechanical deformation in Plastic Packaging Structure Using Moiré Interferometry, SEM Experimental-Numerical Mechanics in Electronic Packaging, Vol. 1, 1997.
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SEM Experimental-Numerical Mechanics in Electronic Packaging
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Dai, X.1
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Poon, T.4
Ho, P.5
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20
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0345817857
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Thermo-mechanical behaviors of electronic packaging materials and structures by high temperature moiré interferometry
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Volume 1, ASME
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Zou, D., Lu, M., and Liu, S., "Thermo-mechanical behaviors of electronic packaging materials and structures by high temperature moiré interferometry," EEP-Vol. 19-1, Advances in Electronic Packaging - 1997, Volume 1, ASME, 1997, pp1191-1196.
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Advances in Electronic Packaging - 1997
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Zou, D.1
Lu, M.2
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