Hot-Electron Trapping in Thin LPCVD Si02 Dielectrics

IEEE Transactions on Electron Devices

Volumn 34, Issue 12, 1987, Pages 2450-2455

  Kawamoto, Galen H ^a   Magyar, Gregory R ^a   Yau, Leopoldo D ^a  

^a INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 3743078728     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/T-ED.1987.23334     Document Type: Article

References (12)

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