Interfacial characteristics and dielectric properties of Ba0.65Sr0.35TiO3 thin films

Thin Solid Films

Volumn 516, Issue 6, 2008, Pages 999-1005

  Quan, Zuci ^a   Zhang, Baishun ^b   Zhang, Tianjin ^b   Zhao, Xingzhong ^a   Pan, Ruikun ^b   Ma, Zhijun ^b   Jiang, Juan ^a  

^a WUHAN UNIVERSITY   (China)

^b HUBEI UNIVERSITY   (China)

Author keywords

BST thin film; BST Pt interface; Dielectric properties; XPS depth profiling

Indexed keywords

BAND STRUCTURE; DEPTH PROFILING; DIELECTRIC LOSSES; LEAKAGE CURRENTS; PERMITTIVITY; TITANIUM OXIDES; X RAY PHOTOELECTRON SPECTROSCOPY;

BREAKDOWN STRENGTH; ENERGY BAND DIAGRAM; LEAKAGE CURRENT DENSITY;

THIN FILMS;

EID: 37349126755     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2007.06.148     Document Type: Article

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