Instability of threshold voltage under constant bias stress in pentacene thin film transistors employing polyvinylphenol gate dielectric

Thin Solid Films

Volumn 516, Issue 6, 2008, Pages 1232-1236

  Kim, Tae Ho ^a   Han, Chang Gi ^a   Song, Chung Kun ^a  

^a Dong A University   (South Korea)

Author keywords

Electronic devices; Interfaces; Organic semiconductors; Stress; Threshold voltage shift

Indexed keywords

BIAS VOLTAGE; ELECTRONIC STATES; GATE DIELECTRICS; HOLE CONCENTRATION; INTERFACES (MATERIALS); SEMICONDUCTING ORGANIC COMPOUNDS; STRESS ANALYSIS; THRESHOLD VOLTAGE;

BIAS STRESS; PENTACENE; THRESHOLD VOLTAGE SHIFT;

THIN FILM TRANSISTORS;

EID: 37349083184     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2007.06.008     Document Type: Article

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