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Volumn 44, Issue 1, 2008, Pages 49-50

C-band side-entry Ge quantum-well electroabsorption modulator on SOI operating at 1V swing

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROABSORPTION MODULATORS; FABRY-PEROT INTERFEROMETERS; INTERFACES (MATERIALS); SILICON ON INSULATOR TECHNOLOGY; STARK EFFECT; SUBSTRATES;

EID: 37249072357     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:20082979     Document Type: Article
Times cited : (68)

References (5)
  • 1
    • 0023108359 scopus 로고
    • Electro optical effects in silicon
    • 10.1109/JQE.1987.1073206 0018-9197
    • Soref, R., and Bennett, B.: ' Electro optical effects in silicon ', IEEE J. Quantum Electron., 1987, 23, p. 123-129 10.1109/JQE.1987.1073206 0018-9197
    • (1987) IEEE J. Quantum Electron. , vol.23 , pp. 123-129
    • Soref, R.1    Bennett, B.2
  • 2
    • 27644490697 scopus 로고    scopus 로고
    • Strong quantum-confined Stark effect in germanium quantum-well structures on silicon
    • 10.1038/nature04204 0028-0836
    • Kuo, Y.-H., Lee, Y.-K., Ge, Y., Ren, S., Roth, J.E., Kamins, T.I., Miller, D.A.B., and Harris, J.S.: ' Strong quantum-confined Stark effect in germanium quantum-well structures on silicon ', Nature, 2005, 437, p. 1334-1336 10.1038/nature04204 0028-0836
    • (2005) Nature , vol.437 , pp. 1334-1336
    • Kuo, Y.-H.1    Lee, Y.-K.2    Ge, Y.3    Ren, S.4    Roth, J.E.5    Kamins, T.I.6    Miller, D.A.B.7    Harris, J.S.8
  • 3
  • 5
    • 84967840983 scopus 로고
    • Frustrated total internal reflection: A demonstration and review
    • 10.1119/1.14514 0002-9505
    • Zhu, S., Yu, A.W., Hawley, D., and Roy, R.: ' Frustrated total internal reflection: a demonstration and review ', Am. J. Phys., 1986, 54, (7), p. 601-606 10.1119/1.14514 0002-9505
    • (1986) Am. J. Phys. , vol.54 , Issue.7 , pp. 601-606
    • Zhu, S.1    Yu, A.W.2    Hawley, D.3    Roy, R.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.