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Volumn , Issue , 2005, Pages 23-32

Experimental evaluation of FSM-based testing methods

Author keywords

[No Author keywords available]

Indexed keywords

DETECTION CAPABILITY; EXPERIMENTAL EVALUATION; FORMAL SPECIFICATION; NUMBER OF METHODS; REACTIVE SYSTEM; RESEARCH COMMUNITIES; SIMPLE CONNECTION PROTOCOLS; TESTING SOFTWARE;

EID: 37249060175     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SEFM.2005.17     Document Type: Conference Paper
Times cited : (21)

References (22)
  • 2
    • 84958061681 scopus 로고    scopus 로고
    • KVEST: Automated generation of test suites from formal specifications
    • Proceedings of World Congress of Formal Methods, Springer-Verlag, Toulouse, France
    • I. Bourdonov, A. Kossatchev, A. Petrenko, and D. Galter. "KVEST: Automated Generation of Test Suites from Formal Specifications". Lecture Notes in Computer Science, N 1708, pp. 608-621, Proceedings of World Congress of Formal Methods, Springer-Verlag, Toulouse, France, 1999.
    • (1999) Lecture Notes in Computer Science , Issue.1708 , pp. 608-621
    • Bourdonov, I.1    Kossatchev, A.2    Petrenko, A.3    Galter, D.4
  • 4
    • 0017973244 scopus 로고
    • Test design modeled by finite-state machines
    • T. S. Chow, "Test design modeled by finite-state machines," IEEE Trans. SE, vol. 4, no. 3, 1978, pp. 178-187.
    • (1978) IEEE Trans. SE , vol.4 , Issue.3 , pp. 178-187
    • Chow, T.S.1
  • 9
    • 0015145477 scopus 로고
    • Checking experiments for sequential machines
    • E. P. Hsieh, "Checking experiments for sequential machines", IEEE Trans. on Computers, Vol. 20, No. 10, 1971, pp. 1152-1166.
    • (1971) IEEE Trans. on Computers , vol.20 , Issue.10 , pp. 1152-1166
    • Hsieh, E.P.1
  • 13
    • 0030212784 scopus 로고    scopus 로고
    • Principles and methods of testing finite state machines - A survey
    • D. Lee and M. Yannakakis, "Principles and methods of testing finite state machines-a survey", Proceedings of the IEEE, vol. 84, no. 8, 1996, pp. 1090-1123.
    • (1996) Proceedings of the IEEE , vol.84 , Issue.8 , pp. 1090-1123
    • Lee, D.1    Yannakakis, M.2
  • 17
  • 18
    • 0024650136 scopus 로고
    • Formal methods for protocol testing: A detailed study
    • D. P. Sidhu, and T. K. Leung, "Formal methods for protocol testing: a detailed study," IEEE Trans. SE, vol. 15, no. 4, 1989, pp. 413-426.
    • (1989) IEEE Trans. SE , vol.15 , Issue.4 , pp. 413-426
    • Sidhu, D.P.1    Leung, T.K.2
  • 22
    • 0011865121 scopus 로고
    • The UIOvmethod for protocol test sequence generation
    • North-Holland
    • S. T. Vuong, W. W. L. Chan, and M. R. Ito, "The UIOvmethod for protocol test sequence generation," Proc. of the IFIP TC6 2nd IWPTS, North-Holland, 1989, pp. 161-175.
    • (1989) Proc. of the IFIP TC6 2nd IWPTS , pp. 161-175
    • Vuong, S.T.1    Chan, W.W.L.2    Ito, M.R.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.