Detection of nickel-induced stress using laser-induced fluorescence signatures from leaves of wheat seedlings

International Journal of Remote Sensing

Volumn 29, Issue 1, 2008, Pages 157-173

  Mishra, K B ^a   Gopal, R ^a  

^a UNIVERSITY OF ALLAHABAD   (India)

Author keywords

[No Author keywords available]

Indexed keywords

CHLOROPHYLL; CURVE FITTING; GRAIN (AGRICULTURAL PRODUCT); HEAVY METALS; OPTICAL RADAR; PHOTOSYNTHESIS; REMOTE SENSING;

FLUORESCENCE INDUCTION KINETICS; LASER INDUCED FLUORESCENCE SPECTRA; WHEAT SEEDLINGS;

IMAGING TECHNIQUES;

LASER INDUCED FLUORESCENCE; LEAF; LIDAR; NICKEL; SEEDLING; SPECTRAL ANALYSIS; WHEAT;

TRITICUM AESTIVUM;

EID: 37249039412     PISSN: 01431161     EISSN: 13665901     Source Type: Journal    
DOI: 10.1080/01431160701280975     Document Type: Article

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